Qualcomm Incorporated

Tun Yong Yang

Arshad Bebal

Tom Kuo

Srini Maddali

Methods and apparatuses are presented for memory page size auto detection. A method for automatically determining a page size of a memory device includes receiving page size extents of the memory device, determining a bus width of the memory device, detecting a number of pages having an automatic detection marker, and determining the page size of the memory device based upon the detected number of pages and the received page size extents. An apparatus for automatically determining page size detection includes logic for performing the above presented method.

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San Diego, CA, United States of America

Tun Yong Yang