Kabushiki Kaisha Toshiba

Yokohama National University

Tsuyoshi Ukyo

Toshihiko Kitazume

Yukio Ishikawa

Fuying Yang

Teruyuki Matsuoka

Yuusuke Kageyama

Keisuke Wakita

According to one embodiment, an error detecting device includes a syndrome processor, an error locator polynomial generator, and a search processor. The syndrome processor is configured to generate syndrome values based on received data. The error locator polynomial generator is configured to generate coefficients for an error locator polynomial based on the syndrome values. The search processor configured to detect an error location by calculating a root of the error locator polynomial. The search processor has a clock controller, a buffer, a polynomial generator, and a first judging module. The clock controller is configured to output or stop a clock signal according to at least one of the coefficients. The buffer is configured to drive the clock signal outputted form the clock controller. The polynomial generator is configured to calculate a part of the error locator polynomial in synchronization with the clock signal driven by the buffer.

Error detecting device and memory system

A multi-variable model analysis system comprises a model creation unit for creating a plurality of models individually having a plurality of variables, a characteristic value calculation unit for calculating the characteristic values of the models on the basis of the variables of the models given and for writing the variables and characteristic values of the models, a clustering unit for classifying the plural models having the characteristic values of a high similarity, into an identical cluster; a correlation coefficient calculation unit for calculating the correlation coefficients of the variables of the models in individual clusters and for writing the correlation coefficients in a memory map; and an extraction unit for extracting the variable having a correlation coefficient exceeding a predetermined value in the individual clusters, from the memory map.

Multi-variable model analysis system, method and program, and program medium

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Yokohama, Japan

Tsuyoshi Ukyo