Omron Corporation

Tsuyoshi Takeuchi

Akihiko Sano

Shuichi Misumi

Kohei Tomita

Akihiro Funamoto

Takuya Nakai

Tomohiro Yamada

Kosuke Morita

Takuya Fukudome

Takanori Kuwahara

Koji Yokota

An insertion determination unit () for precisely calculating a ground insulation resistance component of a leakage current regardless of the presence or absence of an inverter determines whether an inverter () is inserted between a commercial power system () and a three-phase motor (). A resistance component leakage current calculation unit () calculates a ground insulation resistance component of a leakage current on the basis of a calculation procedure corresponding to the result of the above determination.

Leakage current calculation method

A resistance leakage current calculating part calculates an insulation resistance-to-ground leakage current corresponding to a system frequency of a commercial power system, which flows through an insulation resistance-to-ground of a three-phase motor between the three-phase motor and the ground on the basis of a center of a circle which is described by specific points which are specified by a leakage current component and a phase difference which are extracted and calculated at three or more different time points. Accordingly, when the system frequency of the commercial power system and an operating frequency of an inverter device are the same, it is possible to accurately calculate an insulation resistance-to-ground leakage current corresponding to the system frequency.

Leakage current calculation device and leakage current calculation method

A defect number determination unit determines whether or not a solar cell string is defective in a plurality of positions on the basis of whether or not a combined impedance found from impedances in the case where an inspection signal is applied to a P terminal and an N terminal of the solar cell string deviates from a reference impedance by greater than or equal to a predetermined threshold.

Photovoltaic power generation system inspection apparatus and inspection method

A bypass diode with a disconnection fault is identified. A test device includes: a signal introduction circuit that applies a disconnection position identification signal to between a positive electrode and a negative electrode of a solar battery string; and a fault calculating part that identifies the bypass diode with a disconnection fault on the basis of an AC component of a voltage between a frame ground and the positive electrode or an AC component of a voltage between the frame ground and the negative electrode when the disconnection position identification signal is applied.

Test device for a photovoltaic system having solar cell string

A storage unit stores a defect correlation table indicating what influence a given type of defect will have on the inspection of the other types of defects. When an obtainment unit obtains an inspection result of inspecting for a defect, an influence determination unit refers to the defect correlation table and determines the influence of the other types of defects on the inspection result. Information pertaining to the determined influence is outputted via an output unit.

Inspection support apparatus and control method thereof, inspection system, and control program

A solar photovoltaic system inspection apparatus sequentially applies AC inspection signals to a positive electrode and a negative electrode of a solar cell string, and is provided with: an impedance calculation unit configured to measure an indicator value when the signal is applied to the positive electrode, and an indicator value when the signal is applied to the negative electrode, the indicator values varying depending on the number of solar cell modules from the terminal to which the inspection signal was applied to a failure position; and a control unit configured to obtain the failure position based on the ratio of the indicator value measured when the inspection signal was applied to the positive electrode, to the indicator value measured when the inspection signal was applied to the negative electrode.

Growing community of inventors

Aso, Japan

Tsuyoshi Takeuchi