Olympus Corporation

Olympus Optical Company, Ltd.

Tdk Corporation

Tsuyoshi Mochizuki

Kazuhiro Hayashi

Shintaro Takahashi

Yasushi Aono

Minoru Sukekawa

Keiji Shimizu

Masaru Mizunaka

Shinichi Takimoto

Yohei Tanikawa

Akira Matsushita

Yoshihiro Suzuki

Susumu Honda

Yoshihiro Kawano

Ryuichi Hirano

Kazuhiko Osa

Tetsuya Shirota

Ikutoshi Fukushima

Atsushi Yonetani

Hideaki Endo

Keisuke Tamura

Masayoshi Karasawa

Kazutoshi Tsuyutani

Hiroshige Ohkawa

Shogo Usui

An observation system includes an observation apparatus including a housing having an arrangement surface for placement of a sample, the sample including a culture medium, and an external illumination unit which is disposed outside the housing and includes at least one light source configured to emit illumination light. At least a part of the arrangement surface is formed of a transparent member having an optically transparent property. The observation apparatus includes an imaging unit which is provided in the housing and includes an image sensor configured to image, via the transparent member, the sample illuminated by the illumination light from the external illumination unit to acquire images of at least three colors.

Observation system for acquiring images of culture medium in at least three colors

An observation apparatus including: a top plate on which a container in which a specimen is accommodated can be placed, and through which illumination light can pass; a light source that emits the illumination light upward from below the specimen; an objective lens that focuses, below the specimen and the top plate, transmitted light which is the illumination light that has passed through the specimen from thereabove and that has passed through the top plate; and a camera that captures the transmitted light,

Specimen observation apparatus

An observation apparatus including: a light-source that emits illumination light and excitation light upward from below a specimen; and an image-capturing optical system having an objective lens that focuses, below the specimen, transmitted light, which is the illumination light that is emitted from the light-source, that is reflected above the specimen, and that has passed through the specimen, and fluorescence that is generated in the specimen that has been irradiated with the excitation light emitted from the light-source, wherein the light-source is disposed radially outside the objective lens.

Observation apparatus which illuminates and observes a specimen from below

Disclosed herein is a manufacturing method of a circuit board. The manufacturing method includes a first step for preparing a prepreg in which a core material is impregnated with an uncured resin. The prepreg has a through-hole surrounded by the core material and the resin so as to penetrate through the core material and the resin. The manufacturing method further includes a second step for housing a semiconductor IC in the through-hole, and a third step for pressing the prepreg so that a part of the resin flows into the through-hole to allow the semiconductor IC housed in the through-hole to be embedded in the resin.

Circuit board incorporating semiconductor IC and manufacturing method thereof

A microscope includes a microscope main unit including a stage on which a specimen is to be placed; and a light source provided on the microscope main unit and emitting illumination light for illuminating the specimen. The microscope also includes a main power supply operable to be turned on and off; a sensor that senses the presence or absence of a subject in a front or side area of the microscope main unit; a determining unit that determines based on a result of the sensing whether the subject moves; and a control unit that turns on the light source when the main power supply is turned on, maintains the light source in an ON state when the determining unit determines that the subject moves, and turns off the light source when the determining unit determines that the subject does not move and a predetermined period of time passes.

Microscope with motion sensor for control of power supply and light source

An image pickup apparatus has an image sensor recording image information; a dustproof glass for keeping hermeticity of the periphery of the image sensor, placed in front of the image sensor; an optical filter removably placed in front of the dustproof glass; and a camera mount placed in front of the optical filter. The image pickup apparatus further has a parfocal adjusting device in which a focal position where the optical filter is demounted can be adjusted so as to be nearly equal to the focal position where the optical filter is mounted.

Electronic imaging apparatus provided with a dustproof member

A microscope examination apparatus is provided that includes a light source for emitting excitation light or illumination light to a specimen placed on a stage; an objective lens opposing the stage and capable of focusing fluorescence or reflected light from the specimen; an image-forming lens for forming an image of the specimen obtained by the objective lens; and an image-capturing unit for capturing the image of the specimen forming by the image-forming lens, wherein a plurality of the objective lenses having different magnifying powers is provided, and an objective-lens switching mechanism for switching among the objective lenses is provided, and wherein a plurality of the image-forming lenses having different magnifying powers is provided, and an image-forming-lens switching mechanism for switching among the image-forming lenses is provided.

Examination apparatus, fluoroscopy apparatus, examination method, and experimental method

A transmission illumination apparatus for a microscope has an optically transparent sample mount plate on which a sample is mounted, a surface light source that projects substantially uniform illumination light toward the sample mount plate, and a light orientation member that restricts diffusion of the illumination light in relation to at least one direction.

Illumination apparatus for microscope

A condenser lens is disposed in a position facing an objective lens via a specimen, a reflection mirror is movably disposed in the vicinity of an outermost part of a transmitted illuminative light path on the side of a transmitted illuminative light source from the condenser lens, and a laser beam output from a laser oscillation unit is reflected by the reflection mirror and is incident upon the condenser lens.

Total internal reflection fluorescence microscope

A total internal reflection illumination apparatus applied to a microscope which illuminates a sample through an objective having a numerical aperture enabling total internal reflection illumination, comprises a first total internal reflection mirror which is arranged in the vicinity of an outermost peripheral part of an observation optical path of the microscope to reflect an incident illumination light in a direction of the objective, a second total internal reflection mirror which is arranged at a symmetrical position with the first total internal reflection mirror to sandwich an observation optical axis and reflects return light reflected on a surface of the sample in a direction different from the illumination optical path, and a return light dimming part configured to dim the return light reflected by the second total internal reflection mirror.

Growing community of inventors

Hino, Japan

Tsuyoshi Mochizuki