Nec Corporation

Fujirebio Inc.

Tsuyoshi Ando

Yoshiaki Uchida

Kazuya Omi

Takuya Sakyu

Takashi Shirakawa

Yasunobu Okano

Katsutoshi Goishi

Asako Oka

The present invention provides a means and a method for specifically measuring a substance such as a small substance with high sensitivity by a sandwich method. Specifically, the present invention provides an antibody capable of specifically binding to an affinity complex and a method of measuring of the affinity complex comprising measuring the affinity complex using the antibody capable of specifically binding to the affinity complex. The antibody of the present invention may be a full-length antibody. The antibody of the present invention may also have a region derived from an immunoglobulin from an animal having an ability of gene conversion (e.g., a complementarity-determining region, a framework region, or a variable region). Examples of at least one factor that constitutes the affinity complex include a small substance or a protein (e.g., antibody).

Antibody against affinity complex

A logic circuit comprises an input terminal receiving an input signal of input pulses; first and second stages of C-MOS circuit formed by a first MOS FET of one channel type formed in said semiconductor substrate of one conductivity type and a second MOS FET of other channel type formed in well region of other conductivity type formed in the semiconductor substrate, said first and second stages being connected in a cascade connection; a first power terminal applying a first power voltage to the semiconductor substrate; a second power terminal applying a second power voltage to the well region; and a pulse converter converting the input signal to a pulse signal having a reference voltage of the second power voltage and short width pulses of the first power voltage produced in synchronism with the input pulses.

C-MOS logic circuit supplied with narrow width pulses converted from

Growing community of inventors

Tokyo, Japan

Tsuyoshi Ando