Job Corporation

Tsutomu Yamakawa

Shuichiro Yamamoto

Masahiro Okada

Masashi Yamasaki

Yoshiharu Obata

Masashi Yamazaki

In an X-ray inspection, a detection unit with a detector is provided. The detection unit detects transmitted amounts of the X-rays generated by an X-ray generator and transmitted through the object in each of n-number X-ray energy bins (n is a positive integer of 2 or more) which are set in advance to the X-rays, and outputs detection signals corresponding to the transmitted amounts. An information acquisition unit acquires, based on the detection signal, information showing a thickness t of the object and an average linear attenuation coefficient &#x3bc; in a transmission direction of fluxes of the X-rays, in each of the energy bins. A pixel data calculation unit calculates, based on the acquired information, pixel data composed of pixel values each obtained by multiplying addition information by the thickness t. Addition information is obtained by mutual addition of the average linear attenuation coefficients &#x3bc; in the respective energy bins.

X-ray device, x-ray inspection method, and data processing apparatus

A higher accuracy beam hardening correction with a low calculation load is performed with objects whose elements have a wider range of effective atomic numbers Z, thereby contributing to presentation of more quantitative X-ray images. Of two or more X-ray energy bins, two X-ray bins are selected to normalize X-ray attenuation amount &#x3bc;t in those bins such that one or more normalized X-ray attenuation amounts are obtained at each pixel areas. From reference information indicating a theoretical relationship of correspondence between the normalized X-ray attenuation amounts and effective atomic numbers of elements, one ore more effective atomic numbers are estimated every pixel area. Among the one or more effective atomic numbers (Z, Z) and an effective atomic number (Zm) preset for the beam hardening correction, two or more atomic numbers are subjected to their equality determination.

Method and apparatus for processing photon counting-type X-ray detection data and X-ray apparatus

In a data processing apparatus, image data are calculated based on photon counts of an X-ray beam transmitted through an object. Based on the image data, X-ray attenuation information is calculated. The attenuation information includes i) inherent information inherently depending on a type or a property of the object, the inherent information being indicated by a quantity of a vector in an n-dimensional coordinate whose dimension is equal in number to the n-piece energy ranges; and ii) associated information being associated with the inherent information and depending on a length of a path along which the X-ray beam passes though the object. From the attenuation information, only the inherent information is produced which is independent of the associated information. Scattering points corresponding to the inherent information are calculated to be mapped in the n-dimensional coordinate or in a coordinate whose dimension is less than the n-dimensional coordinate.

Apparatus and method of processing data acquired in x-ray examination, and x-ray examination system equipped with the apparatus

Based on counts detected by a photon counting detector, a characteristic of X-ray attenuation amounts &#x3bc;t is acquired for each X-ray energy bin. This characteristic is defined by a plurality of mutually different known thicknesses t and linear attenuation coefficients in the X-ray transmission direction. This substance is composed of a material which is included in an object and which is the same in type as the object or which can be regarded as being similar to the object in terms of the effective atomic number. Correcting data for replacing the characteristic of the X-ray attenuation amounts &#x3bc;t by a linear target characteristic are calculated. The linear target characteristic is set to pass through the origin of a two-dimensional coordinate having a lateral axis assigned to thicknesses t and a longitudinal axis assigned to the X-ray attenuation amounts &#x3bc;t. The correcting data are calculated for each X-ray energy bin.

X-ray apparatus, data processing apparatus and data processing method

An X-ray apparatus includes a two-dimensional pixel array having rectangular pixels outputting an electrical signal responsively to an incident X-ray photon. This array has a row direction oblique to a scan direction. When viewing in the scan direction, a pixel group is provided solely or repeatedly, the pixel group being composed of 'M rows &#xd7; N pieces' of pixels (M is a positive integer equal to or larger than 1, N is a positive integer equal to or larger than 2, and M and N have a relationship of prime numbers). The pixel group occupies a quadrangle whose diagonal line is parallel with the scan direction. In a memory space, the frame data from the pixels are converted to frame data in a Cartesian coordinate system having a row direction which is in parallel with the scan direction and a column direction orthogonal to the row direction.

X-ray detection system, X-ray device, and device and method for processing X-ray detection data

Frame data of tomographic planes that are parallel in the scan direction and between an X-ray tube and an X-ray detecting unit is generated based on detected frame data. The generation of frame data is based on the fan-shaped spreading of an X-ray beam and the differences in position in a height direction between the tomographic planes from a detection surface. Tomographic images are respectively generated from the frame data of the tomographic planes based on laminography technique. Edge information based on the changes in pixel values in each tomographic image is calculated for each pixel. A three-dimensional distribution of the edge information is generated and the edge information is searched in a direction passing through the tomographic planes and pixels indicating a maximum value in the edge information are detected. Only pixels in the tomographic images that positionally correspond to detected pixels are combined into a single composite image.

X-ray inspection apparatus and X-ray inspection method

The type and/or properties of a substance included in an object is identified highly accurately regardless of the thickness of the substance. A data processing apparatus processes counts detected at each of pixels of a photo counting detector in each of a plurality of energy ranges of X-rays. The X-rays are radiated from an X-ray tube, and transmitted through an object. The apparatus calculates an image of the object based on the counts, and sets a region of interest on the image. The apparatus further removes, from the image, pixel information showing a background present in the region of interest, and calculates, pixel by pixel, inherent information inherent to the substance, based on the counts detected at each of the respective pixels in each of the energy ranges of the X-rays in the region of interest. The inherent information indicates a transmission characteristic inherent to the X-rays.

Data processing apparatus and data processing method for X-ray examination, and X-ray examination system provided with the data processing apparatus

A photon counting detector is provided for electrometric waves having a wide wavelength range, such as X-rays, gamma rays, and excited weak fluorescence, by use of a common detecting structure. The detector includes an optical connecting part opposed to an emission surface of a columnar-body array and can adjust a spreading range of light emitted from an emission end face of each of a plurality of columnar bodies. The detector also includes a group of APD (avalanche photodiode) clusters opposed to the emission surface via the optical connecting part. In the group of APD clusters, N&#xd7;N (N is a positive integer of 2 or more) APDs each having a light receiving face are arranged two-dimensionally and the output signals from the N&#xd7;N APDs are combined by a wired logical addition circuit so as to form an APD cluster serving as one pixel. A plurality of such clusters are arranged two-dimensionally.

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Kanagawa, Japan

Tsutomu Yamakawa