National Institute of Advanced Industrial Science and Technology

Konica Minolta Optics, Inc.

Tsutomu Okura

Yoshihiro Nishikawa

Sanekazu Igari

With a light source evaluation deviceaccording to the present invention and a solar cell evaluation deviceemploying the same, a dependency P (&#x3bb;, Ib) for each wavelength &#x3bb; of a short-circuit current Ib generated by white bias light of a measurement target solar cell, which is pre-measured at each of a plurality (i) of irradiance levels, is regarded as a spectral responsivity Pi (&#x3bb;) at each irradiance level, and a value for adjusting a light quantity of an illumination light sourcethat illuminates the solar cellis computed using a spectral responsivity Ps (&#x3bb;), which is computed using the spectral responsivity Pi (&#x3bb;), a pre-supplied spectral irradiance S (&#x3bb;) of reference sunlight, and a pre-measured spectral irradiance L (&#x3bb;) of the illumination light source. Therefore the light source evaluation devicehaving this configuration and the solar cell evaluation deviceemploying the same can accurately adjust the light quantity of the illumination light sourcewhen evaluating the solar cellof which spectral responsivity changes depending on the light quantity.

Light source evaluation device and solar cell evaluation device

An illumination apparatus of the present invention quickly adjusts illuminance of the light radiated from the light source in the irradiation surface to have high uniformity. The illumination apparatus includes the light source that emits a light beam having a rectangular shape, a DMD on which light emitted from the light source is incident and which controls reflection/non-reflection of the incident light by opening/closing control of minute mirrors, an optical system that shapes the light reflected by the DMD, a half mirror that splits the light emitted from the optical system into irradiation light and monitor light, the irradiation surface irradiated with the irradiation light, a monitor unit that measures illuminance of the monitor light, and a control unit that transmits a control signal to control opening/closing of the minute mirrors of the DMD to the DMD, based on a measurement result measured by the monitor unit. In this case, an illuminance distribution in the irradiation surface is adjusted to a predetermined value.

Illumination apparatus and method for obtaining illuminance with high uniformity by controlling a plurality of minute mirrors of a digital mirror device

Growing community of inventors

Hachioji, Japan

Tsutomu Okura