Tdk Corporation

Tsutomu Odashima

Masayuki Sato

Tomoaki Nonaka

Shunichi Yuri

Tetsuo Takaishi

Yosuke Konno

Yasuhiro Ito

Hiroshi Sasaki

Takashi Morita

Takahiro Harada

Yushi Kanou

Toshinari Takahashi

Kenta Yamashita

Matsumi Watanabe

Shinsuke Hashimoto

Kenta Iwasawa

Yushi Kano

Makoto Momota

A dielectric composition contains barium titanate, an oxide of yttrium, and an oxide of magnesium. 0.70&#x2264;&#x3b1;/&#x3b2;&#x2264;1.10 is satisfied, where a content of the oxide of yttrium is &#x3b1; mol part in terms of YO, and a content of the oxide of magnesium is &#x3b2; mol part in terms of MgO.

Dielectric composition and multilayer electronic device

A ceramic electronic component includes an interior part and an exterior part. The interior part includes an interior part dielectric layer and an internal electrode layer. The exterior part includes an exterior part dielectric layer. The exterior part is positioned outside the interior part along a laminating direction thereof. The interior part dielectric layer and the exterior part dielectric layer respectively contain barium titanate as a main component. &#x3b2;&#x2212;&#x3b1;&#x2265;0.20 and &#x3b1;/&#x3b2;&#x2264;0.88 are satisfied, where &#x3b1; mol part and &#x3b2; mol part are respectively an amount of a rare earth element contained in the interior and exterior part dielectric layers, provided that an amount of barium titanate contained in the interior and exterior part dielectric layers is respectively 100 mol parts in terms of BaTiO.

Ceramic electronic component

A ceramic electronic component includes a dielectric layer and an electrode layer. The dielectric layer contains barium titanate and yttrium. The dielectric layer contains dielectric particles and Y&#x2014;Ti segregation particles. An area ratio occupied by the Y&#x2014;Ti segregation particles is 1.3% or less on a cross section of the dielectric layer.

A ceramic electronic component includes a dielectric layer and an electrode layer. The dielectric layer contains a plurality of ceramic particles and grain boundary phases present therebetween. A main component of the ceramic particles is barium titanate. An average thickness of the grain boundary phases is 1.0 nm or more. A thickness variation &#x3c3; of the grain boundary phases is 0.1 nm or less.

The object of the present invention is to provide a method of production of dielectric ceramic composition which can lower the firing temperature without compensating the dielectric characteristics. The method of production according to the present invention is characterized by comprising steps of;

Dielectric ceramic composition and method of production thereof

A production method of a dielectric ceramic composition at least including a main component including a dielectric oxide having perovskite-type crystal structure expressed by a formula ABO(note that in the formula, 'A' indicates one or more elements selected from Ba, Ca, Sr and Mg, and that 'B' indicates one or more elements selected from Ti, Zr and Hf) comprises steps of preparing a main component material including said dielectric oxide expressed by ABO; preparing a subcomponent material including a composite oxide expressed by MRO(SiO)(note that &#x201c;M&#x201d; indicates at least one selected from Ca and Sr, and that &#x201c;R&#x201d; indicates at least one selected from Sc, Y, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb and Lu); mixing said main component material and subcomponent material to obtain a dielectric ceramic composition material; and firing said dielectric ceramic composition material.

Production method of dielectric ceramic composition and production method of electronic device

A dielectric ceramic composition comprising 100 moles of barium titanate as the main component, and furthermore comprising with respect to 100 moles of the main component 0.1 to 3 moles of a first subcomponent including a magnesium oxide, 0.01 to 0.5 mole (note that 0.5 is not included) of a second subcomponent including a yttrium oxide, 0.01 to 0.2 mole of a third subcomponent including a vanadium oxide, and 0.5 to 10 moles of a glass component including a silicon oxide as the main component; wherein a manganese oxide and a chrome oxide are substantially not included, and an average particle diameter of dielectric particles is 0.35 &#x3bc;m or smaller.

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Tokyo, Japan

Tsutomu Odashima