Fujitsu Corporation

Fujitsu General Limited

Tsutomu Ishida

Yuhei Umeda

Yuzi Kanazawa

A non-transitory computer-readable storage medium storing a selection program that causes at least one computer to execute a process, the process includes receiving identification information regarding a terminal from the terminal; selecting one or more user state transition patterns, a number of which is according to the identification information, from among a plurality of the user state transition patterns, which are a plurality of patterns of user state transition obtained by clustering information that indicates the user state transition, which is a time-series transition of a state of a user during a predetermined unit time; and transmitting the one or more user state transition patterns to the terminal.

Storage medium, information processing device, and control method

A control method for causing a computer to perform a process includes: obtaining a trained model for each area of a plurality of areas; detecting a first radiation temperature for each of the areas; blowing blowout air to an area where temperature unevenness is predicted among the plurality of areas on a basis of the detected first radiation temperature for each of the areas and the trained model; detecting a second radiation temperature for the area after the blowout air is blown; and executing re-training of the trained model on a basis of a label related to temperature unevenness created on a basis of the second radiation temperature and the second radiation temperature.

Control method, computer-readable recording medium storing control program, and air conditioning control device

An information processing apparatus includes: a memory; and a processor coupled to the memory and the processor configured to: acquire a plurality of sample videos; identify a position and time at which an attribute appears in each of the plurality of sample videos, the attribute being output by each of one or more pre-trained models to which each of the plurality of sample videos is input; cluster attribute labels based on the position and time of the attribute for each of the plurality of sample videos; and generate a rule by combining attribute labels included in a cluster having a highest frequency of appearance among cluster groups obtained for all of the plurality of sample videos.

Information processing apparatus and rule generation method

A machine learning method executed by a computer, the method includes distributing a first learning model learned on the basis of a plurality of logs collected from a plurality of electronic devices to each of the plurality of electronic devices, the first learning model outputting operation content for operating an electronic device; when an operation different from an output result of the first learning model is performed by a user relative to a first electronic device among the plurality of electronic devices, estimating a similar log corresponding to a state of the learning model in which the different operation is performed from the plurality of logs; generating a second learning model on the basis of a log obtained by excluding a log of a second electronic device associated with the similar log from among the plurality of logs; and distributing the second learning model to the first electronic device.

Machine learning device, machine learning method, and storage medium

A non-transitory computer-readable storage medium storing a program that causes a computer to execute a process, the process includes learning a learning model using a first training data group obtained by excluding a test data group from a plurality of training data items; calculating prediction accuracy of the learning model using the test data group; and when the prediction accuracy satisfies the predetermined requirement, learning an error prediction model for determining whether an error of a value predicted by the learning model satisfies a predetermined requirement, by using a second training data group obtained by excluding the test data group and the first training data group from the plurality of training data items.

Learning method, prediction method, learning device, predicting device, and storage medium

A non-transitory computer-readable recording medium storing a program that causes a computer to execute a procedure, the procedure includes generating, for each of a plurality of wafers, extended coordinates including a position on the wafer and a value calculated from a distance from a center of the wafer and a contribution parameter, for each defect on the wafer by using information of a defect position on the wafer, generating a Betti number group by persistent homology processing for a plurality of extended coordinates generated for each of the plurality of wafers generating, for each of the plurality of wafers, a defect pattern image from a plurality of Betti number groups generated for the plurality of values of contribution parameter, and generating machine learning data associating a plurality of defect pattern images generated for the plurality of wafers with determination information associated with the plurality of wafers.

Data generation method and data generation device

If there are a plurality of activation paths on which a signal propagates during a delay test, multiple-input cells receiving two or more activation paths are extracted by an extraction unit. For the extracted multiple-input cells, whether there is a possibility of occurrence of a multiple-input switching in a multiple-input cell is determined by a determination unit, based on an input timing to each signal multiple-input cell in the two or more activation paths. Then, an occurrence situation of a multiple-input switching is analyzed as one delay cause by an analysis unit, based on a determination result by the determination unit and a result of the delay test.

Delay analysis apparatus, computer-readable recording medium having delay analysis program stored thereon, and delay analysis method

A processing unit includes: a cache memory including a plurality of memory elements; an error detection circuit configured to detect an error when a first timing for reading data from the cache memory is behind a threshold; a latch circuit configured to set a second timing for latching the data based on an output from the error detection circuit and to latch the data at the second timing; and a processing unit core to process the data latched by the latch circuit.

Processing unit

A recording medium stores a program causing a computer to execute determining, for each test pattern measuring operation frequency of a circuit and based on a predicted delay of each path in the circuit, a path candidate determining a measured value obtained via the test pattern and activated by the test pattern; building, for each test pattern yielding a measured value determined by a given path candidate determined at the determining, a model equation expressing discrepancy between the measured value obtained via the test pattern and the predicted delay of the given path candidate, the model equation including parameters representing effects of each path activated by the test pattern on the discrepancy; calculating values of the parameters by using the model equations; determining based on the calculated values, a path determining the measured value obtained via the test pattern and activated by the test pattern; and outputting the determined path.

Computer product and apparatus for failure diagnosis support

A computer-readable medium stores therein a program that causes a computer to execute acquiring for each chip, first delay values of paths in chips manufactured using circuit information concerning a circuit-under-test; building a function model representing a delay value of a path, based on the first delay values for the path and the circuit information; calculating a second delay value of a path included in and having the same configuration in each chip, using a built function model and the circuit information; comparing for each chip, a given calculated second delay value and the first delay value of a given path having a configuration identical to that of the path for which the given second delay value has been calculated; determining based on a comparison result, the given path to be a path that includes a delay error occurring irregularly according to chip; and outputting a determination result.

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Kawasaki, Japan

Tsutomu Ishida