National Yang Ming Chiao Tung University

Taiwan Semiconductor Manufacturing Comp. Ltd.

Mstar Semiconductor, Inc.

Tsung-Yu Tsai

Ta-Sung Lee

Chung-Jung Huang

Chin-Szu Lee

Szu-Hua Wu

Yi-Fan Chen

Hsing-Yuan Huang

Chia-Wei Dai

Tsung-Yi Tsai

Meng-Chun Hsieh

Chih-Chang Wu

A semiconductor process system includes a process chamber. The process chamber includes a wafer support configured to support a wafer. The system includes a bell jar configured to be positioned over the wafer during a semiconductor process. The interior surface of the bell jar is coated with a rough coating. The rough coating can include zirconium.

System and method for performing semiconductor processes with coated bell jar

A method for angle estimation verification, adapted for verifying an estimated angle calculated by an electronic apparatus having an angle estimator and at least three antennas, is provided. The estimated angle is extracted from the angle estimator. An autocorrelation matrix is generated according to a signal vector formed by a plurality of measurements of a received signal received by each of the antennas so as to obtain a plurality of eigenvalues. Among phase difference data generated by a plurality of antenna groups formed by all different combinations of two of the antennas, a plurality of possible estimated angles corresponding to the phase difference data not caused by a coterminal angle effect are calculated. According to the eigenvalues and the possible estimated angles, whether the received signal corresponds to a single target or multiple targets is determined so as to verify the reliability of the estimated angle.

Method and electronic apparatus for angle estimation verification

A motion parameter estimating method, an angle estimating method and a determination method are provided. The methods are adapted for an electronic device. In the angle estimating method, a first frequency modulation continuous wave signal is first transmitted, and at least one antenna receives a second frequency modulation continuous wave signal resulted by a target reflecting the first frequency modulation continuous wave signal. Multiple motion parameters associated with the target are then obtained according to the first frequency modulation continuous wave signal and the second frequency modulation continuous wave signal. Multiple measured values corresponding to the at least one antenna are obtained according to the motion parameters and configuration parameters of the at least one antenna, respectively. Afterwards, the measured values are substituted into a formula to obtain an estimated angle between a preset direction of the electronic device and the target.

Motion parameter estimating method, angle estimating method and determination method

The present invention discloses a measurement device for measuring the gray-to-gray response time. The measurement device is capable of precisely measuring the gray-to-gray response time of an LCD. According to a video signal comprising a synchronous message, the measurement device obtains the initial time and the final time of each gray-to-gray response time interval in the transition of LCD luminance, so as to achieve synchronous measurement of the LCD gray-to-gray response time.

Measurement device for measuring gray-to-gray response time

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Hsinchu, Taiwan

Tsung-Yu Tsai