Omron Corporation

Tsunetoshi Oba

Masashi Isozumi

Tadahiko Ogawa

Takashi Horie

A method for identifying a cause for insufficiency of an output voltage reduced to or below an undervoltage set value comprises a first comparison step for comparing the output voltage to a fixed first undervoltage set value and a second comparison step for comparing the output voltage to a second undervoltage set value that follows up the output voltage with a time lag, wherein the cause for the output voltage insufficiency is identified based on the steps and notified as a warning. As a preferable mode, the first undervoltage set value is set by means of a reverse conducting voltage of a voltage regulating diode Dand the second undervoltage set value is set by means of a charging voltage of a capacitor Cfor directly or indirectly charging the output voltage.

Undervoltage warning method, undervoltage warning circuit and switching power supply

A temperature of an electrolytic capacitorincorporated in equipment is detected, a remaining lifetime in actual use is calculated based on a temperature-lifetime law, and the remaining lifetime is indicated. A thin film tapeis wound around a temperature sensorfor insulation, and the electrolytic capacitorand the temperature sensorare accommodated in a heat-shrinkable tubethe secondary temperature sensoris brought into tight contact with the primary electrolytic capacitor

Remaining lifetime estimating method, temperature detecting structure and electronic equipment

The power supply unit comprises a power supply circuit accommodating chamber A and an arithmetic circuit accommodating chamber B partitioned from each other by a partition wall, and power supply circuit substrates and and an arithmetic circuit substrate are accommodated in the power supply circuit accommodating chamber A and the arithmetic circuit accommodating chamber B, respectively. A connector of the power supply circuit substrate and a connector of the arithmetic circuit substrate are connected to each other through the partition wall of the power supply circuit accommodating chamber A and the arithmetic circuit accommodating chamber B.

Growing community of inventors

Okayama, Japan

Tsunetoshi Oba