Nec Corporation

Renesas Electronics Corporation

Hanwa Electronic Ind. Co., Ltd.

Tsuneo Tsukagoshi

Hiroshi Fukuda

Naoki Kobayashi

Takeshi Watanabe

Mizuki Iwanami

Naoshi Doi

Itsuki Yamada

Masafumi Nakada

Akira Saito

Yoshihiro Ono

Noriaki Ando

Koichi Takemura

Kenichi Hatakeyama

Risato Ohhira

Tomonori Yamada

Hiroo Wakaumi

Toshiyuki Nakaie

Koichiro Nakase

Takumi Okamoto

Shuichi Nitta

Nobuchika Matsui

In an electric/magnetic field probe using an optical fiber, when a stress is applied to the fiber, the polarization state of the light propagating in the fiber changes, and the signal level of the electric or magnetic field detection becomes unstable. For coping with this problem, for suppressing the curve or waggle of the optical fiber caused by a stress applied to the fiber, an electric/magnetic field sensor unit composed of the fiber and EO/MO material is fixed on a quartz substrate, for example, and the part of the fiber other than the sensor unit is stored in an acrylic tube and fixed. Further, polarization adjustment parts like a polarization controller, an optical analyzer or the like is installed in the housing, so that a stress caused by wind pressure or contact is not applied to the fiber connected to the parts.

Probe for electric/magnetic field

A communication medium includes: a first sheet conductor portion; a second sheet conductor portion that is arranged facing the first sheet conductor portion; and a conductor portion that surrounds an end part of the first sheet conductor portion and an end part of the second sheet conductor portion. The second sheet conductor portion includes: a shield part that has no opening part; a communication power feed part that has opening parts; and a matched line part that is provided between the shield part and the communication power feed part, and impedance of which matches with the shield part and the communication power feed part. The conductor portion surrounds the end part of the shield part.

Communication medium

A technique is proposed for reducing leakage electromagnetic field that reduces the electromagnetic leakage from a connection point between a communication coupler and a signal transmission apparatus and that can conduct both communication and transmission of electric power. The signal transmission apparatus includes: a first sheet conductive body portion constituting a lower portion electrode; and a second sheet conductive body portion in a mesh shape which is laminated on the first sheet conductive body portion while a gap area is sandwiched therebetween and which includes an uneven mesh size area on which a sheet impedance is continuously changed.

Communication transmission apparatus, communication coupler and impedance adjusting sheet

There is provided an electromagnetic field measurement apparatus capable of achieving correct and timely circuit operation detection in an area where electronic devices are mounted at high density. An electromagnetic field measurement apparatus includes: a laser light source; a polarized wave controller that linearly polarizes laser light; an optical fiber probe that has an electrooptic material or a magnetooptic material at its leading end and in which the laser light reflected at the leading end is subjected to polarization modulation in accordance with an electric field intensity or a magnetic field intensity; and an analyzer that converts the laser light reflected by the optical fiber probe into intensity modulated light. The laser light source emits time-multiplexed laser light of a plurality of wavelengths different from one another. The electromagnetic field measurement apparatus further includes: an optical circulator that outputs the laser light linearly polarized by the polarized wave controller to a multiplexer/demultiplexer and outputs the laser light input from the multiplexer/demultiplexer to the analyzer; and a multiplexer/demultiplexer that outputs the laser light to different optical fiber probes according to the wavelength of the laser light and outputs the laser light to the optical circulator.

Electromagnetic field measurement apparatus

A semiconductor integrated circuit design apparatus for analyzing a delay in a semiconductor integrated circuit. The semiconductor integrated circuit includes a delay analysis unit, a noise generation unit, a voltage fluctuation level analysis unit and a timing verification unit. The noise generation unit generates noise information based on a predetermined noise definition and the voltage fluctuation level analysis unit analyzes a voltage fluctuation level of the semiconductor integrated circuit when the noise is applied based on the generated noise information. Further, the timing verification unit makes the delay analysis unit analyze the static delay based on the analyzed voltage fluctuation level, to verify timing for operation of the semiconductor integrated circuit based on a result of the static delay analysis.

Semiconductor integrated circuit design apparatus and method for analyzing a delay in a semiconductor integrated circuit

The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform. A TLP generator is used as a rectangular wave generator. The sum of an injection resistance and a matching resistance is set so as to match the characteristic impedance of a transmission line for transmitting a rectangular wave to a test target. A capacitor is connected to a return line of the applied rectangular wave. With this configuration, stable application can be achieved. An error observation function of an electronic circuit gradually increases a peak value of the rectangular wave and determines the immunity based on an application voltage to cause an error for the first time.

Impulse immunity test apparatus

Conductor piecesthat are periodically arrayed, a conductor planethat has openingsperiodically arrayed so as to correspond to the conductor pieces, and a dielectricthat is arranged between the conductor piecesand the conductor plane, are included. Island electrodesand planar inductance elementsare arranged in the openingsof the conductor plane. The island electrodesand the conductor piecesare connected by conductor posts. The island electrodesand the conductor planeare connected through the planar inductance elements

Electromagnetic band gap element, and antenna and filter using the same

An operation analyzing apparatus () for semiconductor integrated circuits according to this exemplary embodiment includes a simulation analyzing unit (), and the simulation analyzing unit () includes: a semiconductor characteristics extracting unit () that extracts the inductances L, resistances R, and capacitances C of a board, a package, and a semiconductor integrated circuit, from the semiconductor integrated circuit mounted on the board via the package; an individual network generating unit () that generates individual networks of the extracted inductance L, resistance R, and capacitance C with respect to each of said semiconductor substrate, said package, and said semiconductor integrated circuit; an integrated network generating unit () that generates an integrated network by integrating all of the generated individual networks; and an operation simulation running unit () that performs an operation simulation of the semiconductor integrated circuit by inserting a test noise pattern to an arbitrary position in the generated integrated network.

Method, apparatus, and system for analyzing operation of semiconductor integrated circuits

A power supply noise sensor includes a noise sensing section A to sense impulse noise applied to a power supply line and an output holding section B to hold a sense output from the noise sensing section A. The noise sensing section A includes a time constant circuit to gradually vary a power supply voltage including impulse noise. When a peak value of the impulse noise reduces after the peak value exceeds a predetermined value, a direction of a current flowing through the time constant circuit is inverted to hold a noise output from the output holding section B also after the impulse noise disappears. Therefore, the impulse noise in the forward direction and the impulse noise in the reverse direction superimposed onto the power supply system of the sensor can be sensed in a simple configuration.

Power supply noise sensor

An apparatus and a method for checking that an electronic circuit device or an electronic circuit component such as an LSI operates normally or abnormally by applying an input pattern to the electronic circuit device or the electronic circuit component together with electromagnetic noises before comparing an obtained output pattern with an expected pattern so as to judge whether or not the patterns match in order to evaluate immunity to electromagnetic noises (conductive or radiation noises).

Immunity evaluation method and apparatus for electronic circuit device and LSI tester

An electromagnetic wave heater comprises an electromagnetic wave generator a wave guide being connected to the generator for guiding the generated electromagnetic wave to be propagated in a uniform direction, at least one container being provided in the wave guide for accommodating an object to be heated up by irradiation of the electromagnetic wave, the container having at least one tapered portion, a pointed end of which faces to a direction of the propagation of the electromagnetic wave in the wave guide.

Electromagnetic wave heater having a cone-shaped container whose tapered

In a method of controlling travel of an automated guided vehicle, the automated guided vehicle is guided to travel along a guide marker arranged in a lattice form when the automated guided vehicle goes straight, and, when it turns, curve travel by autonomous control from a starting lattice point to a target lattice point.

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Tokyo, Japan

Tsuneo Tsukagoshi