Fujitsu Corporation

Tsunaki Iwasaki

Yoshiyuki Iwakura

Kumiko Teramae

Hidenobu Shiihara

A wiring topology display method, includes: obtaining layout information indicating positions of components and wiring coupling the components; dividing first wiring into first pieces of partial wiring, and generating partial wiring information indicating the first pieces of partial wiring; identifying a first length of the partial wiring and a first angle of the partial wiring for a vector; identifying combinations of second pieces of partial wiring based on the first length and the first angle, the second pieces of partial wiring having second lengths which are a certain length or more, second angles which are different by a certain angle, and a distance which is a certain distance or less; identifying a group having the combinations including pieces of identical partial wiring; and symbolizing third pieces of partial wiring at both ends of the group and fourth pieces of partial wiring between the third pieces of partial wiring.

Wiring topology method and information processing device

A computer-readable-recording-medium stored a program for causing a computer to execute: judging, for each of elements of a plurality of scattering parameters, whether a difference between a first-area in a plane containing an axis representing frequency and an axis representing the element, and a second-area in the plane is within a permissible range, the first-area being surrounded by a first-element-value series of the element that is defined in advance for a plurality of first-frequencies, the second-area being surrounded by a second-element-value series that is obtained by performing interpolation calculation from the first-element-value series for a plurality of second frequencies which are different from the plurality of first-frequencies and which are provided at regular intervals; and determining, by performing the judging for one interval or a plurality of intervals, an interval so that the difference falls within the permissible range for all of the elements of the plurality of scattering parameters.

Growing community of inventors

Sagamihara, Japan

Tsunaki Iwasaki