Ricoh Company, Ltd.

Konica Minolta, Inc.

Spin Sensing Factory Corp.

Tsukasa Yagi

Takuji Hatano

Koujirou Sekine

Masaaki Tsuchida

Masahiro Imada

A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means. The method includes determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position. The mark is detectable by the other non-destructive inspection means. The method further includes causing the other non-destructive inspection means to inspect an inspection target including the mark. The method further includes contrasting detection results by the multiple different types of non-destructive inspection means in reference to the mark which is the marking position.

Non-destructive inspection method

A synchronization circuit includes a first flip-flop circuit to hold an input signal which is asynchronous to a clock signal by the clock signal, and output an output signal, a second flip-flop circuit to hold the input signal by a signal of an opposite phase to the clock signal and output a signal, a comparing unit to compare the input signal and the output signal of the first flip-flop circuit and output a signal with a high or low level depending on whether the input signal and the output signal of the first flip-flop circuit have the same level, a selection unit to select one of the output signal of the first flip-flop circuit and the output signal of the second flip-flop circuit depending on the level of the signal outputted by the comparing unit, and a third flip-flop circuit to output the output signal selected by the selection unit.

Synchronization circuit

Growing community of inventors

Hyogo, Japan

Tsukasa Yagi