Hitachi High-tech Corporation

Hitachi-high-technologies Corporation

Tsuguhiko Satou

Toshihide Hanawa

Satoshi Shibuya

Hirofumi Sasaki

Yoshihiro Naitou

An analysis method of an automatic analyzer is provided. The automatic analyzer includes: an insertion unit into which a rack is inserted; a transport line that transports the rack; a detection unit that detects a rack identifier from a rack or an attribute from a sample container which accommodates therein a sample as an object to be examined and which is mounted on a rack; an analysis module that includes a light source and a spectrometer which measures a measurement value to analyze a sample; a rack standby unit in which a rack stands by; and, a rack recovery unit that recovers a rack. In the automatic analyzer, a rack stands by in the rack standby unit until a measurement result in the analysis module is output; and is then recovered to the rack recovery unit. The analysis method includes: a step of transporting a rack from the rack insertion unit to the transport line, making the transported rack stand by until a measurement result in the analysis module is output, and then recovering the rack to the rack recovery; a step of detecting an identifier from the rack or an attribute from a sample container accommodating a sample and mounted on the rack; and a step of, when a rack transported subsequent to the rack of interest is transported from the rack insertion unit to the transport line, recovering the subsequent rack to the rack recovery unit without standing by in the rack standby unit.

Analysis method of automatic analyzer

Provided is an automatic analyzer capable of switching an apparatus operation mode, such as automatic reexamination, without stopping measurement by efficiently using a rack. The automatic analyzer includes a storage unit that stores an operation mode, such as automatic reexamination, of the automatic analyzer, a detection unit that detects an operation mode switching rack inserted into an insertion unit, and a control unit that switches the operation mode stored in the storage unit on the basis of the detection of the operation mode switching rack by the detection unit. The control unit applies the switched operation mode to an examination object rack transported from the insertion unit to a transport line after the operation mode switching rack.

Automatic analyzer

Disclosed is an automatic analysis device in which a check item at a time of an analysis start can be set in accordance with a skill level of an operator, an analysis can be performed after the check item being displayed and confirmed, and erroneous measurement caused due to a missed check can be prevented. The check item such as checking the remaining quantity of a reagent or the like displayed in a check screen before the analysis start can be set for each type of operator, each day, each time. The set check item is configured to be displayed in a screen before the analysis start, and unless the operator confirms the check item, the analysis start is not allowed in principle. An automatic analysis device which can prevent erroneous measurement caused due to a missed check of the operator before the analysis start is realized.

Growing community of inventors

Tokyo, Japan

Tsuguhiko Satou