University of Michigan

Tsuey I Chen

Michael D Morris

A photothermal deflection detector for thin layer chromatography includes a translation means for holding and moving a thin layer chromatographic plate; a first impinging laser beam (e.g., 20 mW chopped argon laser) focused on the moveable thin layer chromatographic plate; a second probing laser beam (e.g., 2 mW He-Ne laser) intersecting the impinging laser beam directly above and parallel to the moveable thin layer chromatographic plate; and a laser deflection measuring means (e.g., knife edge, photodiode detector and lock-in amplifier demodulator) responsive to the thermal lens effect created by the absorption of the impinging laser beam by the separated compounds on the thin layer chromatographic plate. Such a system when applied to separated compounds (e.g., 1,2-napthaquinone, phenanthrenequinone and .alpha.-ionone) exhibits detection limits that range from 30 ng to 7.5 pg, depending upon the compounds's ability to absorb the impinging light.

Growing community of inventors

Ann Arbor, MI, United States of America

Tsuey I Chen