Taiwan Semiconductor Manufacturing Comp. Ltd.

Tse-Hung Chen

Chung-Chieh Yang

Yung-Shun Chen

Tai-Yi Chen

Chih-chiang Chang

A system for fabricating a semiconductor device includes one or more data processors configured to perform operations commanded by instructions stored in a non-transitory computer-readable medium. The instructions include receiving a layout including a plurality of elements, extracting parasitic values associated with the layout to generate a resistance and capacitance (RC) netlist, generating a modified RC netlist by adding element names of the elements of the layout to the RC netlist, performing a post-layout simulation on the modified RC netlist to determine whether the layout meets a predetermined specification, and fabricating a semiconductor device based on the layout when it is determined that the layout meets the predetermined specification. The RC netlist includes the extracted parasitic values. The modified RC netlist includes a netlist table storing the element names and the extracted parasitic values.

System and method for fabricating a semiconductor device

A noise detection circuit includes an analog-to-digital conversion (ADC) circuit and a noise event recognition circuit. The ADC circuit is configured to convert an analog signal outputted from a device under test (DUT) into a sequence of digital codes. The noise event recognition circuit, coupled to the ADC circuit, is configured to determine a noise count of the sequence of digital codes, and refer to the noise count to determine if a noise event occurs in the DUT. The noise count indicates a number of times a change in code values between two successive digital codes exceeds a predetermined value.

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Taipei, Taiwan

Tse-Hung Chen