Advanced Micro Devices Corporation

Trent Johnson

Chandrakant Pandya

Steven R Klassen

John Heon Yi

Satwant Singh

Richard Alan Hamersley

Michael Gregory Tarin

Jeff Brinkley

Hooi-Min Lim

Glenn Eubank

Apparatus and methods for remotely configuring a computer BIOS of a testing computer system are provided. In one aspect, a method of testing is provided that includes establishing an interface between a first computer system and a second computer system. The second computer system includes a computer readable storage device that has a BIOS and a first set of BIOS configuration settings. The first set of BIOS configuration settings is adapted to a first device under test. At least one instruction is sent from the first computer system to the second computer system to enable the second computer system to select a second set of BIOS configuration settings adapted to a second device under test having different electronic characteristics than the first device under test. An electrical test is performed on the second device under test using the second computer system and the second set of BIOS configuration settings.

Method and apparatus for remote BIOS configuration control

A burn-in test system. A burn-in test system includes a device under test (DUT), a temperature controller coupled to the DUT, and a test controller. During testing, the test controller: (a) sets a parameter of the DUT to a first value and applies a test stimulus to the DUT, and (b) sets the parameter of the DUT to a second value and applies the test stimulus to the DUT. A change in the value of the parameter results in a change in the amount of heat dissipated by the DUT. The temperature controller maintains the DUT at a pre-determined temperature during testing with the parameter set to both the first and the second values. The DUT may be further coupled to a module that comprises circuitry employed in a product-level application environment. The module is configured by the test controller to simulate a product-level application.

Burn-in using system-level test hardware

In one embodiment, a method may include generating a test code segment including a number of selected opcodes and executing the test code segment for a plurality of iterations. The method may also include saving a first test result of the execution of the test code segment after a first iteration and comparing additional test results of each subsequent iteration with the first test result. The method may further include determining whether any of the additional test results are different than the first test result.

Method and system for self-assembling instruction opcodes for a custom random functional test of a microprocessor

In one embodiment, a method may include generating a test code segment including a number of selected opcodes and executing the test code segment from a particular location within the memory for a first iteration. The method may also include saving a first test result of the execution of the test code segment after the first iteration. In addition, the method may include executing the test code segment for subsequent iterations and after each iteration of the test code segment, shifting the test code segment a predetermined number of locations from the particular location within the memory. The method may further include comparing test results of each subsequent iteration with the first test result and determining whether any of the subsequent test results are different than the first test result.

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Austin, TX, United States of America

Trent Johnson