International Business Machines Corporation

Globalfoundries Inc.

Avago Technologies General IP (singapore) Pte. Ltd.

Travis Reynold Hebig

Derick Gardner Behrends

Todd Alan Christensen

Daniel Mark Nelson

Michael Launsbach

Joseph Paul Kuczynski

Chad Allen Adams

Steven R Nickel

Igor Arsovski

Peter Thomas Freiburger

Jesse Daniel Smith

John Edward Sheets, Ii

Kirk David Peterson

Robert E Meyer, Iii

Richard John Stephani

Daniel A Dobson

David Paul Paulsen

Myron Buer

Reid A Wistort

Elizabeth Lair Gerhard

Michael Thomas Fragano

Carl A Monzel

Jayson K Wittrup

Write assist circuitry is disclosed to assist a memory device in changing logical states during a write operation. The write assist circuit includes write assist circuits which can be coupled to a shared boost capacitor to provide write assistance to the memory device. The write assist circuit includes boost switch circuit to selectively couple one or more of the write assist circuits and the shared boost capacitor. The one or more write assist circuits, when coupled to the shared capacitor, provide negative bitline assistance by selectively driving one of its corresponding bitlines pairs to be negative during a write operation.

Method and apparatus for selective write assist using shared boost capacitor

A composition for recyclate verification is produced by adding a predetermined quantity of one or more verification compounds to a base resin. Each of the verification compounds is thermally stable over a range of temperatures that includes the maximum processing temperature of the base resin but is less than the degradation temperature of the base resin. In some embodiments, a thermoplastic material provided for verification as a recyclate is analyzed to detect the presence (and, optionally, the loading level) of one or more verification compounds associated with the base resin of the thermoplastic material. In some embodiments, a computer-implemented method for recyclate verification is performed using a computer program product. In some embodiments, a thermoplastic material verified as a recyclate is heated to drive off the verification compound(s), then a known quantity of the verification compound(s) is added to the recyclate, which is then blended with virgin base resin material.

Recyclate verification

One or more brevetoxins or other toxins produced by red tides or other harmful algal blooms (HABs) are removed from a body of water by contacting an aqueous phase containing water, algae and one or more HAB-produced toxins with an organic phase, extracting the one or more toxins into the organic phase, and separating the organic phase enriched in the one or more toxins from the aqueous phase depleted in the one or more toxins. In some embodiments, the organic phase is comprised of vegetable oil, mineral oil, or other suitable oil. In some embodiments, an annular centrifugal contactor is used to accomplish the contacting, extracting, and separating. In some embodiments, the toxin-depleted aqueous phase is pumped back into the source of the aqueous phase, and the toxin-enriched organic phase is recirculated until a predetermined threshold concentration of the one or more toxins is met.

Removal of HAB-produced toxins from bodies of water

A high-bandwidth multiple-read memory device includes multiple memory blocks, multiple address input buses, and a number of output data buses. The memory blocks include an auxiliary memory block and each memory block include several memory sub-blocks including an auxiliary memory sub-block. The output data buses output data corresponding to addresses corresponding to the address input buses during a multiple-read operation. The addresses correspond to a single memory sub-block of the memory sub-blocks of a memory block. Also described is differential XOR circuit that includes a selection logic circuit, a precharger circuit, and a multiplexer. The selection logic circuit provides a complementary output signal corresponding to a single-ended input signal. The multiplexer provides, during an evaluate phase, a differential output signal.

High bandwidth memory and glitch-less differential XOR

An integrated circuit including a sense amplifier connected to a sense line is provided. The sense amplifier is configured to end a precharge phase of the sense line based on a state of the sense amplifier. A single-ended sense amplifier determines its own precharge level, ends the precharge phase, and starts evaluation as soon as precharge is ended, without waiting for a globally timed signal to end the precharge phase.

Self-timed, single-ended sense amplifier

Circuits and methods for performing search operations in a content addressable memory (CAM) array are provided. A system for searching a CAM includes a circuit that selectively activates a main-search of a two stage CAM search while a pre-search of the two stage CAM search is still active.

Content addressable memory early-predict late-correct single ended sensing

A method and structure are provided for implementing low temperature wafer testing of a completed wafer. A coolant gel is applied to the completed wafer, the gel coated wafer is cooled and one or more electrical test probes are applied through the gel to electrical contacts of the cooled wafer, and testing is performed.

Implementing low temperature wafer test

Embodiments of the disclosure provide a method for removing residual BPA from a residual BPA-containing substance and a method for making a container with residual BPA removed. The method may consist of preparing a stabilization reagent, wherein water is removed from the stabilization reagent. The method may also include preparing the residual BPA-containing substance. The method may also include reacting the residual BPA-containing substance in a melt condensation process with the stabilization reagent, wherein the stabilization reagent is non-toxic.

Binding Bisphenol A in a polycarbonate container

A device includes a device casing and a water-soluble circuit located within the device casing. An identification code is encoded on the circuit. The identification code is associated with the device.

Detecting water intrusion in electronic devices

A level shifter circuit for coupling a first circuit, that uses a first supply voltage, with a second circuit, that uses a second supply voltage, includes an input node to receive an input signal and an output node to output to a level-shifted output signal corresponding with the input signal. An idle state on the input node corresponds with a particular binary logic value that is maintained for a first time period, and which is detected by a detection sub-circuit. Further, the level shifter circuit includes a first inverter that uses the second supply voltage, and has a feedback path between the input and output of the first inverter. The feedback path includes a first resistive element and a first transmission gate. The first transmission gate is configurable to open the feedback path when the detection sub-circuit detects an idle state on the input node of the level shifter circuit.

Level shifter for a time-varying input

A tamper resistant electronic device includes multiple eFuses that are individually blown in each instance the electronic device is tampered with. For example an eFuse is blown when the electronic device is subjected to a temperature that causes solder reflow. Since it is anticipated that the electronic device may be tampered with in an acceptable way and/or an acceptable number of instances, functionality of the electronic device is altered or disabled only after a threshold number of eFuses are blown. In certain implementations, the threshold number is the number of anticipated acceptable tamper events. Upon a tamper event an individual eFuse is blown. If the total number of blown eFuses is less than the threshold, a next eFuse is enabled so that it may be blown upon a next tamper event.

Growing community of inventors

Rochester, MN, United States of America

Travis Reynold Hebig