Micron Technology Incorporated

Travis E Swanson

Paul J Voit

Ryan M Przybilla

Roy Edgar Greeff

Jeffrey Jay Rooney

Steven R Van Kirk

Ryan M Przbilla

The present disclosure includes methods and systems for channel skewing. One or more methods for channel skewing includes providing a number of groups of data signals to a memory component, each of the number of groups corresponding to a respective channel, and adjusting a phase of a group of data signals corresponding to at least one of the number of channels such that the group of data signals are skewed with respect to a group of data signals corresponding to at least one of the other respective channels.

Channel skewing

Methods and systems for channel skewing are described. One or more methods for channel skewing includes providing a number of groups of data signals to a memory component, each of the number of groups corresponding to a respective channel, and adjusting a phase of a group of data signals corresponding to at least one of the number of channels such that the group of data signals are skewed with respect to a group of data signals corresponding to at least one of the other respective channels.

A system and method to provide memory test patterns for the calibration of a delay locked loop (DLL) using a pseudo random bit sequence (PRBS) stored in a serial presence detect (SPD) circuit memory. The test bits stored in the SPD memory are transferred to a memory controller register (MCR) and implemented on the system data bus as test patterns that closely simulate run-time switching conditions on the system bus, so as to allow more accurate calibration of the DLL. Test data write/read operations may be performed while signals for the test patterns are present on various bit lines in the data bus so as to allow for accurate determination or adjustment of the value for the delay to be provided by the DLL to the strobe signals during memory data reading operations at run time. Memory chips may also be tested over an operating range of values using the generated test patterns.

Providing memory test patterns for DLL calibration

A system and method to generate memory test patterns for the calibration of a delay locked loop (DLL) using pseudo random bit sequences (PRBS) generated through a pair of liner feedback shift registers (LFSR). The generated patterns are implemented on the system data bus as test patterns that closely simulate run-time switching conditions on the system bus, so as to allow more accurate calibration of the DLL. Test data write/read operations may be performed while signals for the test patterns are present on various bit lines in the data bus so as to allow for accurate determination or adjustment of the value for the delay to be provided by the DLL to the strobe signals during memory data reading operations at run time. Memory chips may also be tested over an operating range of values using the generated test patterns.

Generation of memory test patterns for DLL calibration

Systems and methods for selecting pin functionality in memory controllers are provided. These memory controllers have pins that can be used to drive different types of signals, depending on the type of memory coupled to the memory controller. For example, pins can be used to drive clock signals or chip select signals. Accordingly, because different types of memory require different numbers of clock and chip select signals, the same memory controller can be advantageously used with different types of memory. Moreover, memory controller pins that would ordinarily go unused with some types of memory can now be used to increase the number of such memories that can be coupled to the memory controller.

Memory controllers having pins with selectable functionality

A method and apparatus for signal processing may include an electronic circuit comprising a receiver configured to receive a signal and a dynamic threshold circuit configured to process the signal. The dynamic threshold circuit is configured to compare the signal to a threshold and generate an output signal according to the comparison. The dynamic threshold circuit is also configured to change the threshold to a selected level at a selected time. In various embodiments, the selected level is selected to be a level between the level of the input signal and a midpoint of the input signal. In another embodiment, the selected time is selected to correspond to a stabilization time of the input signal.

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Ramsey, MN, United States of America

Travis E Swanson