Globalwafers Co., Ltd.

Memc Electronic Materials, Inc.

Memc Singapore Pte. Ltd.

Memc Singapore Pte. Ltd. (uen200614794d)

Tracy Michelle Ragan

Alexis Grabbe

Vandan Tanna

Hui Wang

James Raymond Capstick

Guoqiang David Zhang

Mark Crooks

Dale A Witte

Mick Bjelopavlic

Michele Haler

Polishing slurries for polishing semiconductor substrates are disclosed. The polishing slurry may include first and second sets of colloidal silica particles with the second set having a silica content greater than the first set.

Semiconductor substrate polishing methods

A method of processing a semiconductor wafer includes depositing a silicon layer on the semiconductor wafer. The silicon layer has a substantially uniform thickness. The silicon layer is polished to smooth the silicon layer such that the thickness is substantially uniform after polishing.

Methods for processing semiconductor wafers having a polycrystalline finish

Polishing slurries for polishing semiconductor wafers

Semiconductor substrate polishing methods and slurries and methods for manufacturing silicon on insulator structures

The present disclosure generally relates to methods for recovering silicon from saw kerf, or an exhausted abrasive slurry, resulting from the cutting of a silicon ingot, such as a single crystal or polycrystalline silicon ingot. More particularly, the present disclosure relates to methods for isolating and purifying silicon from saw kerf or the exhausted slurry, such that the resulting silicon may be used as a raw material, such as a solar grade silicon raw material.

Methods to recover and purify silicon particles from saw kerf

Methods to slice a silicon ingot

A wafer carrier for retaining at least one semiconductor wafer in a processing apparatus during a processing operation which removes wafer material by at least one of abrading and chemical reaction. The processing apparatus is adapted for removing wafer material from a front side and a back side of each wafer simultaneously. The carrier includes a plate including wafer contaminating material and having an opening and a thickness. An insert has a thickness and is disposed in the opening for receiving at least one wafer and engaging a peripheral edge of the wafer to hold the wafer as the carrier rotates. The thickness of the insert is significantly greater than the thickness of the plate to inhibit removal of material from the plate and thereby inhibit bulk metal contamination of the wafer.

Wafer carrier

Methods of slicing ingots of semiconductor material into wafers using a wire saw. The wire saw includes a wire that is movable in a forward direction and a reverse direction for slicing the ingots. The methods include defining an identification region of each wafer to be sliced from the ingots and aligning an alignment feature of the ingots in approximately the same position relative to the wire saw for each of the ingots. The identification region of the wafer is adapted for marking with an identification mark after slicing. The methods also include slicing the ingot into wafers with the wire saw. The slicing step includes moving the wire in the forward and reverse directions during slicing except when slicing in the identification region of each wafer and moving the wire only in the forward direction when slicing in the identification region of each wafer. In slicing the ingot into wafers, thickness variations relative to the size of the identification mark are reduced in the identification region.

Method of slicing silicon wafers for laser marking

Growing community of inventors

Warrenton, MO, United States of America

Tracy Michelle Ragan