Agilent Technologies, Inc.

Covidien LP

Nellcor Puritan Bennett Incorporated

Tracy Eliasson

Greg Lund

Yu Jung Pinto

Ronald K Kerschner

Dean C Buck

Bryan Hansen

Bryan Scott Hansen

Corinne H Johnson

Corinne Johnson

Anthony C Turner

Provided herein are methods and apparatuses for facilitating clinical acceptance of patient monitoring features. These methods may be used in conjunction with a computer that includes software for viewing the type of display associated with the monitoring feature. The clinical acceptance systems as provided herein may display a new or experimental monitoring feature along with a benchmark feature that a clinician is familiar with. In certain embodiments, the viewing tool may be isolated from the calculation tools so that the computer may include stored files that are in a format ready for display.

Clinical acceptance tool

Display screen with a graphical user interface

The need for a Time Domain Integration line scan camera to change a workpiece's height in z to relocate an ROF (Range Of Focus) of fixed excursions about a fixed POLB (Plane Of Least Blur) is removed by making the location of the POLB movable, thus making the location of the associated ROF variable, while leaving the actual z height of the workpiece unchanged. This can be accomplished by ensuring that, for a desired new location of the POLB, the rate at which the physical &#x394;ys transpire for the motion of the workpiece (which may be a PCA) matches the rate at which the optical &#x394;ys are clocked for the TDI image sensor. That may be achieved by varying the value for physical &#x394;y as function of the POLB's location in z regardless of V, but while also adjusting Vif that is necessary or desirable to keep such things as sensor cell exposure levels, and contrast from moving away from their optimum values.

Method for relocating the range of focus in a line scan camera having time domain integration image sensors

The magnification Mfor a line scan camera can be found by exploiting a difference in the way Maffects the notion of 'focus' in the x and y directions. Menters into the calculations for selecting z while focusing in the y direction, but not in x. A thin opaque calibration target is provided at a convenient height in z called the reference plane, and has straight edges aligned parallel to the x and y directions. To find Mthe line scan camera forms images of the calibration target over a range of trial z values known to include the height of the calibration target. An arbitrary and possibly incorrect trial value Mof Mis then assumed and many slices of the calibrations target are calculated. Within these slices the edge parallel to the x direction will be sharply defined for some z, while at some other zthe edge parallel to the y direction will be sharply defined. Make a note of e=z. Repeat these steps for some number different trial Mthat cover the plausible range of M. Now fit a curve (e.g., a quadratic) to the data set {(e, M)}, and find the y-intercept (where e=0). The associated value of M is the magnification Min the reference plane containing the calibration target, and we found it without knowing the actual length of any part of the calibration target.

Method for determination of magnification in a line scan camera

An x-ray inspection system. The x-ray inspection system includes an x-ray source, an on-axis x-ray sensor, at least one off-axis x-ray sensor, a fixture, and an accumulation circuit. The on-axis x-ray sensor is configured to capture on-axis images of radiation from the x-ray source. The x-ray source is displaced from the on-axis x-ray sensor, and the x-ray source and the on-axis x-ray sensor are positioned on an axis conceptually drawn between the x-ray source and the on-axis x-ray sensor. At least one off-axis x-ray sensor is configured to capture off-axis images of radiation from the x-ray source, wherein each off-axis x-ray sensor is positioned off the axis. The fixture is configured to maintain an article between the x-ray source and the on-axis and off-axis x-ray sensors, and the accumulation circuit is configured to receive and accumulate images captured by the on-axis and off-axis x-ray sensors.

X-ray inspection system having on-axis and off-axis sensors

Growing community of inventors

Boulder, CO, United States of America

Tracy Eliasson