Omron Corporation

Toyoo Iida

Hitoshi Nakatsuka

Masanori Sato

Tomoki Ishizawa

Yutaka Kato

Yasuyuki Ikeda

Junji Shimamura

Hitoshi Oba

Yosuke Iwai

Tomonori Ariyoshi

Toshimichi Masaki

Yuki Taniyasu

Noboru Kawaike

Reiji Takahashi

Kengo Ichimura

Ryuichiro Takaichi

Kazuhiro Shono

Akira Ishida

Yorihisa Ikenaga

On the basis of a measured shape, which is a three-dimensional shape of a subject measured by means of a measuring unit using an image captured when an image capturing unit is disposed in a first position and a first attitude, a movement control unit determines a second position and a second attitude for capturing an image of the subject again, and sends an instruction to a movement mechanism. The three-dimensional shape is represented by means of height information from a reference surface. The movement control unit extracts, from the measured shape, a deficient region having deficient height information, and determines the second position and the second attitude on the basis of the height information around the deficient region of the measured shape. The position and attitude of the image capturing unit can be determined in such a way as to make it easy to eliminate the effects of shadows.

Vision sensor system, control method, and non-transitory computer readable storage medium

A configuration capable of realizing object authentication with higher accuracy is desired. A measurement system includes a shape measurement unit that performs measurement, a storage unit that stores an entire model for each work piece type, and a recognition processing unit that executes object authentication based on whether or not a three-dimensional shape measured by the shape measurement unit is consistent with any one entire model stored in the storage unit. The entire model for each work piece type is specified by a combination of a plurality of partial models and each of the plurality of partial models is correspondently given a degree of importance. The recognition processing unit determines whether or not the three-dimensional shape is consistent with any one entire model based on degrees of importance corresponding to one or more partial models included in the entire model.

Measurement system and measurement method

A measurement system includes a first distance calculation unit that searches for a corresponding region, indicating a same array as an array of codes indicated by a predetermined number of reference patterns included in a unit region set in the projection pattern, from a set of the codes, and calculates a distance from an irradiation reference surface of the projection pattern to each portion of the object on the basis of a search result of the corresponding region, and a second distance calculation unit that attempts to estimate a distance for the defective portion for which the first distance calculation unit is not able to calculate the distance by reconstructing an incomplete code corresponding to the defective portion using peripheral information in the input image.

A measurement system includes a first search part and a second search part. The first search part searches a set of codes for a corresponding region that indicates the same sequence as a model code string composed of a predetermined number of codes included in a unit region set in a projection pattern. The second search part searches the set of codes for a code that matches each code included in a model code string that fails in the search for the corresponding region among the model code strings included in the projection pattern, and then determines recognition of the model code string when the number of the codes that fail to be searched in this search is equal to or smaller than a predetermined number.

An image processing system (SYS) specifies an arrangement situation of a workpiece (W) provided by a line (L). The image processing system (SYS) specifies a normal (V) with respect to a set measurement point (Wp) of the workpiece (W) according to the specified arrangement situation of the workpiece (W), and changes a position and posture of the two-dimensional camera () so that the specified normal (V) matches an optical axis of the two-dimensional camera () (S). The image processing system (SYS) changes a distance between the two-dimensional camera () and the measurement point (Wp) so that the specified normal (V) matches the optical axis of the two-dimensional camera (), to focus the two-dimensional camera () on the measurement point (Wp).

Image processing system, image processing device, and image processing program

An imaging unit has its imaging field of view containing the conveyor, and images a subject in the imaging field. The imaging unit generates a luminance image representing the subject and a range image including height information indicating a height of at least one point on the subject from the conveyor by imaging the subject. A measurement unit measures a position of each workpiece in the luminance image. An obtaining unit obtains an overlap order of the workpieces based on the height information in the range image corresponding to the position of each workpiece in the luminance image. A determination unit determines the workpiece pickup order to allow a workpiece having a highest place in the overlap order to be picked up with a higher priority than other workpieces.

Image processing system, image processing apparatus, workpiece pickup method, and workpiece pickup program

A three-dimensional model data producing processing apparatus produces three-dimensional model data using design data (CAD data) of an object to be recognized. The three-dimensional model data producing processing includes processing conversion processing, edit processing, and teaching processing. The conversion processing and the edit processing are performed to the design data on a computer. The teaching processing is performed in a practical environment. It is not necessary to image a workpiece model in the three-dimensional model data producing processing.

Model producing apparatus, model producing method, and computer-readable recording medium in which model producing program is stored

To provide a three-dimensional monitoring apparatus capable of detecting with high accuracy an incoming of an object into a predetermined three-dimensional space by using pattern light as a detecting carrier. A three-dimensional monitoring apparatus comprising (1) an irradiating device for irradiating predetermined pattern light to three-dimensional space S to be monitored, (2) an imaging device for imaging a projection pattern projected by irradiating of the pattern light on an incoming object M and on a screenin the space S to capture image data and (3) a measuring device to measure a position of the object M based on the comparison between a monitoring image captured by the imaging device when there is the object M in the space S and a reference image captured by the imaging device when there is no object M in the space S.

Three-dimensional monitoring apparatus

An image recording system includes first imaging means for imaging operations of manufacturing equipment in a production line, second imaging means arranged downstream from the manufacturing equipment for imaging articles processed by the manufacturing equipment, inspection means for inspecting the processed articles based on image data outputted from the second imaging means, and an image recording apparatus for acquiring data outputted from the first imaging means and the inspection means, wherein the image recording apparatus is equipped with a temporary storage portion for temporarily storing image data from the imaging means, storage means, and control means for reading out any desired interval from the image data stored a prescribed time interval portion in the past in the temporary storage portion and storing such read out interval when a signal based on inspection results outputted from the inspection means is received.

Image recording apparatus and image recording system

An image recording apparatus for recording image data of an inspection object and inspection data corresponding to inspection results outputted at their own respective timings from an inspection apparatus which judges quality by an image recognition process is equipped with a temporary storage portion for temporarily storing the image data and the inspection data, a storage device, and a control portion for synchronizing the image data and the inspection data and storing the synchronized image data and inspection data in the storage device based on relative position data from a prescribed signal sent from the inspection apparatus, wherein the control portion accesses the temporary storage portion to acquire previous data for at least the prescribed signal.

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Nagaokakyo, Japan

Toyoo Iida