Average Co-Inventor Count = 3.04
ph-index = 3
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. National Institute for Materials Science (16 from 551 patents)
2. Other (1 from 832,891 patents)
3. Tokyo Institute of Technology (1 from 567 patents)
18 patents:
1. 11856664 - Method and system for preventing dew condensation and light scattering due to dew condensation
2. 11486843 - Dryness/wetness responsive sensor
3. 11454603 - Dew point measuring method and dew point measuring device
4. 11163829 - Search method, search device, and search system
5. 11138772 - Search system, search method, and material property database management apparatus
6. 10830573 - Droplet size determining device and droplet size determining method
7. 10267756 - Dryness/wetness responsive sensor having first and second wires spaced 5 nm to less than 20 μm apart
8. 10043598 - Process for precipitation of conducting polymer/metal composites, and conducting polymer/metal composites
9. 9957371 - Nanoparticle-containing polymer nanowire and method for producing the same
10. 9825180 - Thin-film transistor and method for manufacturing same
11. 9703197 - High-sensitivity multilayer resist film and method of increasing photosensitivity of resist film
12. 9622346 - Adhesive body comprising conductive polymer-metal complex and substrate and method for forming the same, conductive polymer-metal complex dispersion liquid, method for manufacturing the same and method for applying the same, and method for filling hole using conductive material
13. 8759925 - Method for reducing thickness of interfacial layer, method for forming high dielectric constant gate insulating film, high dielectric constant gate insulating film, high dielectric constant gate oxide film, and transistor having high dielectric constant gate oxide film
14. 8575038 - Method for reducing thickness of interfacial layer, method for forming high dielectric constant gate insulating film, high dielectric constant gate insulating film, high dielectric constant gate oxide film, and transistor having high dielectric constant gate oxide film
15. 7759662 - Field electron emission element, a method of manufacturing the same and a field electron emission method using such an element as well as an emission/display device employing such a field electron emission element and a method of manufacturing the same