Kabushikikaisha Tokyo Keiki

Toyohiko Kitada

Takanori Arioka

An ultrasonic thickness gauge including a split-type probe to perform the transmission-reception of ultrasonic waves via a material board to be measured, a zero point calibration circuit to delay the zero point by a specified delay time from the wave transmission timing, and a measuring circuit to count clock pulses for the duration from the zero point to the wave reception timing. This ultrasonic thickness gauge is characterized in that it also includes a counter to count, within specified range, the clock pulses relating to the board thickness in each previous measurement conducted by using the preset zero point, and a zero point adjusting circuit to vary the zero point of the zero point calibration circuit in proportion to the count value of the above-mentioned counter. In addition, a coefficient selecting circuit to shift the proportionality coefficient of the zero point adjusting circuit step by step in accordance with the board thickness obtained in each previous measurement may be included for measuring a wider range of board thickness.

Ultrasonic thickness gauge

A pulse reflection type ultrasonic thickness meter having an ultrasonic transducer which supplies an ultrasonic pulse wave to an object to be measured and receives an echo pulse from the object and a counter which counts the time difference between the transmission of the ultrasonic pulse wave and the echo pulse. In this case, a switching circuit is provided which controls the counter in such a manner that a power source is disconnected from the counter during a non-measurement time period.

Growing community of inventors

Sagamihara, Japan

Toyohiko Kitada