Kabushiki Kaisha Toshiba

Hitachi, Ltd.

Nippon Mining & Metals Co., Ltd.

Canon Medical Systems Corporation

Toshiba Medical Systems Corporation

Jx Nippon Mining Metals Corporation

Toshiba Infrastructure Systems & Solutions Corporation

Toshiyuki Ono

Takashi Ida

Shuhei Nitta

Hiroaki Nakai

Nobuyuki Matsumoto

Hidenori Takeshima

Toshimitsu Kaneko

Tomoyuki Takeguchi

Taichiro Shiodera

Wataru Watanabe

Takayuki Itoh

Atsushi Matsumura

Yasunori Taguchi

Isao Tsushima

Satoshi Kawata

Shuji Soga

Kiyoshi Kumagai

Kazuhiko Taniguchi

Norihiro Kimijima

Izumi Ota

Jumpei Ando

Kenzo Isogawa

Akira Kagami

Tenta Sasaya

Mitsuo Sudo

Takashi Watanabe

Masahiro Saito

Keiji Kojima

Yuichi Yagawa

Takuma Yamamoto

Atsushi Miki

Kenichi Shimoyama

Yasunori Chiba

Hideta Arai

Kenta Moriyasu

Ryo Fukuchi

Kenji Baba

Akira Ushijima

Kenichi Funaki

Hajime Momoi

Satoru Morioka

Mai Murashima

Haruko Nagaoka

Nao Mishima

Rei Hasegawa

Takeshi Mita

Masashi Nishiyama

Tomohisa Imamura

Yukinobu Sakata

Go Kawata

Shunsuke Kimura

Hiroaki Miyazaki

Tatsuya Tokunaga

Ryota Osumi

Takashi Sumiyoshi

Susumu Kubota

Yasuharu Hosono

Masaaki Tanizaki

Chizuko Yasunobu

Makoto Hirohata

Naoyuki Kanda

Emi Tamura

Yasutoyo Takeyama

Norio Yuki

Toru Taniguchi

Masao Ishiguro

Yoshihiro Chiba

Kenji Nagamatsu

Kiyoaki Nishikawa

Kazuhiko Fukamachi

Chisa Nagai

Masazumi Mori

Yoshihiro Ozeki

Yo Takeuchi

Tetsuo Kawahara

Masataka Araki

Saori Asaka

Tomomu Ishikawa

Keisuke Kawauchi

Shuhei Furuya

Kenji Ohya

This signal processing device includes one or more processors. The processors receive, as an input, an input signal that is a third signal obtained by superposing a second signal on a first signal or a fourth signal obtained by converting the third signal, and estimate a feature of the first signal on the basis of the input signal. The processors execute inference on the basis of the feature and outputs an inference result.

Device, method, and computer program product for executing inference using input signal

According to one embodiment, a wall detection device includes an acquirer and processing circuitry. The acquirer acquires a point cloud, which includes a series of coordinates of a plurality of points corresponding to a first wall and a second wall that oppose each other. The processing circuitry detects a first detected wall and a second detected wall based on a model and the acquired point cloud, the model representing a first plane which corresponds to the first detected wall and indicates a surface of the first wall and a second plane which corresponds to the second detected wall and indicates a surface of the second wall, and the model representing the first plane and the second plane being parallel to each other.

Wall detection device, transport vehicle, and wall detection method

According to one embodiment, a control method includes setting a transmission angle of an ultrasonic wave to a standard angle. The control method further includes transmitting an ultrasonic wave at the set transmission angle and detecting an intensity of a reflected wave from an object. The control method further includes calculating a tilt angle based on a gradient of the intensity. The tilt angle indicates a tilt of the object. The control method further includes resetting the transmission angle based on the tilt angle.

Control method, inspection system, and storage medium

According to one embodiment, an image processing apparatus incudes processing circuitry. The processing circuitry generates, for N processed images based on an input image, N being an integer equal to greater than 3, N feature amounts by performing feature amount extraction processing using a neural network, stores process data generated during the feature amount extraction processing in a memory, selects a maximum feature amount by performing two or more comparisons with M combinations among the N feature amounts, M being an integer equal to 2 or more and (N−1) or less, and releases (M−1) or less pieces of process data that correspond to (M−1) or less feature amounts not having been selected from the memory for each of the two or more comparisons.

Image processing apparatus, learning apparatus, inference apparatus, and image processing method

In order to assist participants in thinking of an idea by acquiring audio data, it is provided a workshop assistance system, which includes a computer having an arithmetic apparatus configured to execute predetermined processing, a storage device coupled to the arithmetic apparatus, and a communication interface coupled to the arithmetic apparatus, the computer being configured to access solved problem case data including information of solved cases that correspond to problem data, the workshop assistance system comprising: a problem processing module configured to search, by the arithmetic apparatus, solved cases based on problem data that is generated from a discussion among participants; and an idea generation module configured to present, by the arithmetic apparatus, idea data including the generated problem data and information of the solved case found in the search to the participants.

Workshop assistance system and workshop assistance method

A data processing apparatus includes a processor. The processor generates visualization data for displaying estimation results of manufacturing conditions based on estimation results and relationship data. The relationship data includes first relationship data as a relationship between first manufacturing conditions recorded during an analysis, and second relationship data as a relationship between second manufacturing conditions corresponding. The processor divides the estimation results of the manufacturing conditions into a first group based on the first relationship data, and into a second group based on the second relationship data. The processor generates the visualization data based on a change in manufacturing condition relationship between the first group and the second group.

Data processing apparatus, data processing method, and storage medium storing program for determining an abnormality based on manufacturing data

According to one embodiment, an estimation device includes a processor. The processor accepts information. The information is acquired by each of a plurality of ultrasonic sensors transmitting an ultrasonic wave in a second direction toward a weld portion and receiving a reflected wave. The ultrasonic sensors are arranged in a first direction. The second direction crosses the first direction. The processor estimates a range of the weld portion in the second direction based on an intensity distribution of the reflected wave in the second direction. The processor calculates a centroid position of an intensity distribution of the reflected wave in the first direction for each of a plurality of points in the second direction, and estimates a range of the weld portion in the first direction based on a plurality of the centroid positions.

Estimation device, inspection system, estimation method, and storage medium

According to one embodiment, an anomaly detection apparatus includes a processing circuit configured to calculate a reconstruction error of an input signal being a time-series signal, calculate cycle information indicating cyclic property of the reconstruction error, and determine presence/absence of an anomaly signal in the input signal on the basis of the cycle information or the cycle information and the reconstruction error.

Anomaly detection apparatus, method, and program

An abnormality score calculation apparatus according to an embodiment includes a processing circuit configured to: acquire first data concerning a status of a product or a manufacturing process; calculate based on the first data an abnormality score for a respective one of a plurality of abnormality modes or for a respective one of a plurality of pieces of the first data of various types; and convert a scale of a respective one of a plurality of abnormality scores including the abnormality score in such a manner that the abnormality scores become substantially equal in occurrence degree.

Abnormality score calculation apparatus, method, and medium

According to one embodiment, a data analysis apparatus includes a processor. The processor acquires, for a plurality of products as analysis targets, manufacturing data including at least one manufacturing condition for each product. The processor calculates, based on a bias of state data representing a degree that the product is in a specific state in at least one item that can be taken concerning one manufacturing condition extracted from the manufacturing data, an index value representing a degree that a cause of the specific state of the product is the manufacturing condition.

Data analysis apparatus, method and system

A magnetic resonance imaging apparatus according to an embodiment includes an MRI system and a processing circuitry. The MRI system includes a receiving coil to receive a magnetic resonance signal. The processing circuitry is configured to generate an image based on the magnetic resonance signal, the image including a plurality of pixels; calculate a feature value corresponding to a signal value of the pixel; correct the feature values based on a sensitivity of the receiving coil; and reduce noise in the image based on distribution of the corrected feature values.

Magnetic resonance imaging apparatus, image processing apparatus, and image processing method

According to an embodiment, a processing apparatus includes a hardware processor. The hardware processor is configured to: cut out, from an input signal, a plurality of partial signals that are predetermined parts in the input signal; execute processing on the plurality of partial signals using neural networks having the same layer structure with each other to generate a plurality of intermediate signals including a plurality of signals corresponding to a plurality of channels; execute predetermined statistical processing on signals for each of the plurality of channels for each of the plurality of intermediate signals corresponding to the plurality of partial signals, to calculate statistics for each channel and generate a concatenated signal by concatenating the statistics of the plurality of respective intermediate signals for each channel; generate a synthetic signal by performing predetermined processing on the concatenated signal; and output an output signal in accordance with the synthetic signal.

Processing apparatus, processing method, learning apparatus, and computer program product

A visualized data generation device includes an acquisitor, an analyzer, and a generator. The acquisitor acquires manufacturing data including one or more pieces of first data Yi regarding a product state with respect to one product. The analyzer analyzes the first data Yi acquired by the acquisitor and derives a first index value with respect to each piece of the first data Yi. The generator generates visualized data including a first analysis result display region for causing a display device to display information about the first index value. The generator generates the visualized data in which an amount of information and a priority is set for each first analysis result display region on the basis of the first index value and a display form of the first analysis result display region is set on the basis of the amount of information and the priority.

Visualized data generation device, visualized data generation system, and visualized data generation method

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Kawasaki, Japan

Toshiyuki Ono