Hamamatsu-photonics K.k.

Toshiyasu Suyama

Mototsugu Sugiyama

Tadashi Maruno

Shinji Takihi

Toshihide Sasaki

Junichi Sonoda

Tatsuya Onishi

Haruki Suzuki

Tetsuya Taka

Kunihiko Tsuchiya

An imaging unit includes a housing having an entrance window that allows radiation transmitted through an object to pass through, a scintillator having an input surface to which radiation passing through the entrance window is input, and a line scan sensor having an imaging surface that captures an image of scintillation light output from the input surface. The imaging unit further includes a slit member placed between the entrance window and the scintillator and configured to guide radiation passing through the entrance window toward the input surface and a 1×lens placed between the scintillator and the line scan sensor and configured to form scintillation light output from the input surface into an image on the imaging surface of the line scan sensor.

Imaging unit, radiological image acquisition system, and radiological image acquisition method

A foreign matter inspection device includes: an X-ray application unit configured to apply an X-ray to an inspection object carried by a carriage unit; an X-ray detection unit configured to detect an X-ray transmitted by the inspection object and to output X-ray image data based on the detection result; an infrared ray application unit configured to apply an infrared ray to the inspection object carried by the carriage unit; and an infrared ray detection unit configured to detect the infrared ray from the inspection object and to output infrared image data based on the detection result. The infrared ray application unit and the infrared ray detection unit are covered by a protection unit formed of a member blocking the X-ray and transmitting the infrared ray.

Foreign matter inspection device

A radiographic inspection apparatus acquires a first image and a second image; receives an input of selection of a region of interest in the first image or the second image; specifies respective first pixel values of a plurality of first pixels and respective second pixel values of a plurality of second pixels corresponding to the plurality of first pixels, and calculates a thickness correction function by approximating a relationship between the first pixel values and the second pixel values; calculates a plurality of representative data each of which is a combination of a first representative value and a second representative value on the basis of the respective first pixel values of the plurality of first pixels and the respective second pixel values of the plurality of second pixels; and calculates an evaluation coefficient based on a correlation between the thickness correction function and the plurality of calculated representative data.

Radiographic inspection method, radiographic inspection apparatus, radiographic inspection system, and radiographic inspection program

An imaging unit includes a housing having a wall portion in which a slit for passing radiation is formed, a scintillator having an input surface to which radiation passing through the slit is input, a first mirror that reflects scintillation light output from the input surface, and a line scan camera that detects scintillation light reflected by the first mirror. The scintillator is placed to make the input surface parallel to both the conveying direction and a line direction. The first mirror is positioned outside an irradiation region connecting the peripheral edge of the slit to the input surface of the scintillator.

Imaging unit and radiation image acquisition system

A radiation image acquisition system includes a radiation source that outputs radiation toward an object, a scintillator that has an input surface to which the radiation output from the radiation source and transmitted through the object is input, converts the radiation input to the input surface into scintillation light, and is opaque to the scintillation light, an image capturing means that includes a lens portion focused on the input surface and configured to image the scintillation light output from the input surface and an image capturing unit configured to capture an image of the scintillation light imaged by the lens portion and outputs radiation image data of the object A, and an image generating unit that generates a radiation image of the object based on the radiation image data output from the image capturing means.

Radiation image acquisition system and radiation image acquisition method

An X-ray detection devicecomprises a low energy scintillatorconfigured to convert an X-ray of a low energy range into scintillation light, a low energy line sensorconfigured to detect the scintillation light to output image data, a high energy scintillatorconfigured to convert an X-ray of a high energy range into scintillation light, and a high energy line sensorconfigured to detect the scintillation light to output image data. Pixels L of the low energy line sensorand pixels H of the high energy line sensorare identical in number and are aligned at an identical pixel pitch, and a minimum filtering process is executed on the image data from the low energy line sensor, while an averaging process is executed on the image data from the high energy line sensor

Radiation detection device, radiation image acquisition device, and radiation image acquisition method

An apparatus for capturing a radiation image includes a radiation source configured to emit radiation, a wavelength converter configured to receive the radiation emitted from the radiation source through an entrance plane after the emitted radiation has been transmitted by an object, to convert the received radiation to scintillation light, and to output the scintillation light from the entrance plane, a first optical system configured to focus on the entrance plane and to image the output scintillation light thereby generating a first radiation image of the object, and a first image sensor configured to capture the first radiation image to generate first image data.

Radiation image acquisition device

A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.

Radiation detection device, radiation image acquiring system, radiation inspection system, and radiation detection method

An image acquisition device is an image acquisition device that acquires an X-ray transmission image of an object conveyed in a conveyance direction, and the image acquisition device includes an X-ray irradiator that outputs an X-ray, a belt conveyor that conveys the object in the conveyance direction, an X-ray detection camera having a scintillator that converts an X-ray penetrating the object into scintillation light, a line scan camera that detects the scintillation light and outputs a detection signal, and an amplifier that amplifies the detection signal at a predetermined set amplification factor and outputs a amplified signal, a controller that generates an X-ray transmission image based on the amplified signal, and an amplifier controller that sets one of a first amplification factor or a second amplification factor corresponding to an amplification factor lower than the first amplification factor as the set amplification factor based on a predetermined imaging condition.

Image acquisition device and image acquisition method

A radiation image acquisition system of an aspect of the present invention includes a radiation source emitting radiation toward an object, a holding unit holding the object, a wavelength conversion member generating scintillation light in response to incidence of the radiation emitted from the radiation source and transmitted through the object, a first imaging means condensing and imaging scintillation light emitted from an incidence surface of the radiation of the wavelength conversion member, a second imaging means condensing and imaging scintillation light emitted from a surface opposite to the incidence surface of the wavelength conversion member, a holding unit position adjusting means adjusting the position of the holding unit between the radiation source and the wavelength conversion member, and an imaging position adjusting means adjusting the position of the first imaging means.

Radiation image acquisition system

A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a direction of a normal thereto.

A nondestructive inspection devicecomprises an X-ray indicator, a low-energy detector, a high-energy detector, a low-energy transmittance calculation unit, a high-energy transmittance calculation unit, a detection unit, and a correction unit. The calculation unitcalculates a value indicating the transmittance of transmission X-rays in a low energy range. The calculation unitcalculates a value indicating the transmittance of transmission X-rays in a high energy range. The detection unitdetects a positional deviation detail of the X-ray indicatoraccording to a ratio between the transmittances calculated by both of the calculation units. When the positional deviation detail of the X-ray indicatoris detected by the detection unit, according to the positional deviation detail, the correction unitcorrects X-ray luminance data detected by the detectors

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Hamamatsu, Japan

Toshiyasu Suyama