Omron Corporation

Toshiro Miyachi

Takaaki Yamada

Yosuke Iwai

Masahito Tanaka

Ikuo Nanno

Yosuke Wai

In a method of controlling the temperature of a target object by measuring to obtain detected temperatures at a plurality of measurement positions and controlling a processing device such as a heater such that each detected temperature will match the corresponding one of target temperatures set for the processing device, a preliminary step is taken to determine the degrees of interference at the measurement positions by varying the target temperatures and the degrees of interference thus determined are used to correct the set target temperatures or the detected temperatures.

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Yokohama, Japan

Toshiro Miyachi