Seiko Epson Corporation

Toshioki Shimojima

Masami Maeda

Takashi Yamazaki

Toshiyuki Kamiya

Mitsuhiro Yamamura

Hiroaki Fujimori

Hideaki Oka

Daisuke Kirihara

Fuyumi Takata

Hajime Kobayashi

Takayuki Imai

Haruhiko Miyamoto

Nobuo Hasegawa

A robot includes a sensor including an electrode portion of a sensor for detecting approach of or contact with another object is formed on an outer surface or an inner surface of an exterior member, and in which a drive unit of the robot main body is controlled so as to avoid approach between the robot body and the other object based on an output signal of the sensor.

Sensor and robot

An electronic component transport apparatus includes: an openable and closable first opening and closing portion; a first rotation support portion which supports the first opening and closing portion to be rotatable; a second opening and closing portion provided to be openable and closable in the first opening and closing portion; and a second rotation support portion which supports the second opening and closing portion to be rotatable. An area of the first opening and closing portion is greater than an area of the second opening and closing portion.

Electronic component transport apparatus and electronic component inspection apparatus

A handler includes: a rotating section which is a holding unit mounting section which can take a mounted state in which a holding unit for holding an IC device is mounted; and a transportation mechanism which transports the IC device held by the holding unit. The rotating section includes a heat generation section which generates heat and a heating flow path through which fluid which is heated by the heat generation section and is used for heating of the IC device passes.

Handler and inspection apparatus

A handler includes a supply shuttle plate on which a device is placed and cooled, and a transfer robot configured to transfer the device placed on the supply shuttle plate from the supply shuttle plate. The transfer robot includes an adsorbing portion configured to adsorb the device placed on the supply shuttle plate thereon, a vertical movement arm configured to move the adsorbing portion away from the supply shuttle plate, an arm box configured to accommodate the adsorbing portion together with the device in a state of being kept away from the supply shuttle plate, and a dry air supply unit configured to supply dry gas into the arm box.

Part inspection apparatus and handler

A handler includes a base having an opening portion, a first hand which transports a transport target, a first transport section which transports the first hand to above the opening portion and moves the first hand down, a second hand which transports the transport target, a second transport section which transports the second hand to above the opening portion and moves the second hand down, and a control section which controls an operation of the first transport section and an operation of the second transport section. The handler has a state where the first hand and the second hand are disposed in parallel to the opening portion while being close to each other toward above the opening portion.

Handler and part inspection apparatus

A handler includes first and second cooling channels, and first and second supply channels. The first and second cooling channels correspond to housing pockets that are respectively heated by heaters. A first throttle valve controls the flow of refrigerant such that the amount of refrigerant flowing through the second cooling channel is larger than the amount of the refrigerant flowing through the first cooling channel. Temperature sensors detect the temperature of the respective housing pockets, and a control device controls the valve and the heaters so that a target temperature is maintained.

Handler provided with a temperature control unit

A handler includes a storage tank which stores liquid nitrogen, supply channels which supply refrigerant from the storage tank to inner passages of a first shuttle, a valve which opens and closes the supply channel, and a heat exchanger which has vaporization chambers with larger flow path cross-sectional areas than those of the supply channels to vaporize liquid nitrogen within the vaporization chambers. According to this structure, the respective vaporization chambers are filled with nitrogen gas produced by preceding vaporization. Thus, pressure fluctuations produced by successive vaporization of liquid nitrogen can be reduced. Moreover, nitrogen gas is supplied to the respective inner passages. Accordingly, excessive cooling for part housing pockets can be prevented.

Growing community of inventors

Suwa, Japan

Toshioki Shimojima