Other

Toshio Okuno

Masatomo Nagashima

Etsuji Suzuki

Tadashi Furumi

Gunji Mizutani

Akira Yonezawa

Atsushi Oguma

An apparatus for inspecting a display board or a circuit board in which an inspection terminal of an inspection probe block B is pressed into contact with an electrode pad of a display board or a circuit portion P for inspection. A probe block supporting frame member has an expandable and contractible structure, and when the probe block supporting frame member is expanded, a board supporting frame member can be relatively advanced. Due to the relative advancement of the board supporting frame member , the display board or the circuit board P protrudes forward of a distal end of the terminal of the probe block B through an enlarged opening area of the probe supporting frame member , so that the display board or the circuit board P supported on the board supporting frame member can be exchanged with another board.

Apparatus for inspecting display board or circuit board

A unit has inspection block blocks mounted thereon in parallel, wherein a plurality of inspection probe blocks are inserted into and removed from a guide rail through a slider so that the probe blocks can be loaded or replaced. Each probe block is slidingly moved along the guide rail so that its positional adjustment can be made in an extension length of the guide rail. Only one kind of support base can commonly be used by inserting and removing different probe blocks with respect to the support base and the positional adjustment can be done. The unit with inspection probe blocks mounted thereon in parallel includes a support base and a plurality of inspection probe blocks each having a plurality of blocks and arranged on the support base in parallel. The probes of each inspection probe block are contacted with electrodes of a display panel or wiring circuit board so that inspection can be carried out, wherein a guide rail is disposed on the support base, the inspection probe blocks are slidably fitted to the guide rail through a slider, and each inspection probe block is fixed to the support base at a predetermined slide position.

Unit with inspection probe blocks mounted thereon in parallel

A supporting framework for a display panel or a probe block is capable of properly coping with display panels of different sizes in a testing apparatus. By moving a framework with a display panel supported thereon or by moving frame members of the framework with a probe block supported thereon, an opening (or space) defined by the respective frame members can be enlarged or reduced.

Supporting framework for display panel or probe block

A rectangular support framework for a flat panel display as an object to be tested or a testing probe block is disclosed. The rectangular support framework comprises an upper cross frame plate which is capable of moving vertically alone with respect to a right vertical frame plate and which is capable of moving vertically in association with vertical movement of a left vertical frame plate, a lower cross frame plate which is capable of moving vertically alone with respect to the left vertical frame plate and which is capable of moving vertically in association with vertical movement of the right vertical frame plate, the left vertical frame plate which is capable of moving laterally alone with respect to the upper cross frame plate and which is capable of moving laterally in association with lateral movement of the lower cross frame plate, and the right vertical frame plate which is capable of moving laterally alone with respect to the lower cross frame plate and which is capable of moving laterally in association with lateral movement of the upper cross frame plate. The vertical movement and lateral movement of the upper and lower cross frame plates and left and right vertical frame plates enlarge or reduce a window which is defined by the upper and lower cross frame plates and left and right vertical frame plates. The flat panel display or the testing probe block which is subjected to pressure contact with electrode pads arranged on a peripheral edge portion of the flat panel display is supported on the upper and lower cross frame plates and left and right vertical frame plates which defined the enlarged or reduced window.

Flat panel display or probe block support framework

A contact structure of a lead in which a contact structure having a lead and a bump made of suitable metals, respectively, can be formed easily and the bump and the lead can be soundly connected together in terms of electricity and strength. The contact structure of the lead comprises a lead formed by etching a conductive foil and a bump formed by electric casting by means of plating. The bump and the lead are formed of different metals, respectively, and the bump is connected to a surface of the lead through a conductive connecting material The lead is intimately contacted at a surface, on which the bump is disposed, with a first main surface of a holeless insulative sheet A basal portion of the bump is forcibly pierced into and extended all the way through the thickness of a material of the holeless insulative sheet and a side surface of the basal portion of the bump is fusion-adhered to an inner wall surface of the through-hole A distal portion of the bump is projected from a second main surface of the insulative sheet

Contact structure of lead

A wiring board structure has an insulating base having at least one projection located thereon, wherein the insulating base and the at least one projection are integrally formed from a same piece of insulating material. The wiring board structure also has at least one lead located on the insulating base, wherein a part of the at least one lead covers the at least one projection to form at least one conductive bump.

Growing community of inventors

Kanagawa-ken, Japan

Toshio Okuno