Horiba, Ltd.

Toshio Ohta

Kyoji Shibuya

Katsumi Nishimura

Kensuke Fukushiro

Shun Fukami

Shintaro Aoki

The present invention relates to an analysis apparatus adapted to analyze a measurement target component contained in a sample by irradiating a measurement cell into which the sample is introduced with pulse-oscillated light, whereby suppressing reduction in wavelength resolution without shortening the pulse width. The analysis apparatus includes multiple light sources adapted to produce pulse oscillations, a light detector adapted to detect light emitted from the light source and transmitted through the measurement cell, and a signal separation part adapted to separate, from a light intensity signal obtained by the light detector, signals corresponding to a part of pulses from the light sources.

Analysis apparatus and analysis method

The present invention is adapted to include: a light source adapted to emit reference light that is light whose wavelength is modulated at a predetermined modulation frequency; a light detector adapted to detect the intensity of measurement target light that is light after the reference light has transmitted through the measurement target component, and the intensity of the reference light; a first calculation part adapted to calculate an intensity ratio logarithm that is the logarithm of the ratio between the intensity of the measurement target light and the intensity of the reference light; a frequency component extraction part adapted to lock-in detect the intensity ratio logarithm with a reference signal having a frequency n times the modulation frequency; and a second calculation part adapted to, on the basis of the result of the detection by the frequency component extraction part, calculate the concentration or absorbance of the measurement target component.

Analysis apparatus, program for analysis apparatus, and analysis method

An exhaust gas analyzing apparatus of a vehicle mounted type equipped with an analyzer that is configured to analyze components contained in exhaust gas includes a sampling line that is an exhaust gas flow path extending from an exhaust gas introduction terminal that is configured to introduce the exhaust gas from the outside to the analyzer; a pressure reduction source that is configured to reduce a pressure in the sampling line to a predetermined pressure; and a temperature-regulating mechanism that is configured to regulate a temperature of the exhaust gas flowing in the sampling line to be at least a first temperature. The first temperature is set to be a temperature equal to or higher than an evaporation temperature of moisture at the reduced predetermined pressure and lower than an evaporation temperature of moisture at one atmospheric pressure.

Growing community of inventors

Kyoto, Japan

Toshio Ohta