Nhk Spring Co., Ltd.

Topura Co., Ltd.

Yamakin Co., Ltd.

Toshio Kazama

Shigeki Ishikawa

Takeshi Suzuki

Hiroshi Nakayama

Noritoshi Takamura

Kohei Hironaka

Shinya Miyaji

Kazuya Souma

Tomohiro Kawarabayashi

Yoshio Yamada

Kazushi Watanabe

Kotaro Toyotake

Mitsuhiro Nagaya

Shigeto Mori

Noriyoshi Kaneda

Yoshihisa Tani

Osamu Ito

Shogo Imuta

Satoshi Shoji

Teruo Anraku

Mitsuhiro Kondo

Kohei Suzuki

Tomohiro Kubota

Akihiro Matsui

Masayuki Ainoya

Hitoshi Abe

Shun Hirai

Hiroyasu Sotoma

Masami Kudo

Kenji Nanseki

An elastic member is an elastic member formed of a wire having a cross section that is substantially circular, the cross section being orthogonal to a longitudinal direction, and the elastic member being expandable and contractible in a predetermined direction; and including: a first alloy portion that is made of an aluminum alloy having a tensile strength larger than 950 MPa and equal to or less than 1100 MPa at room temperature; and a second alloy portion configured to cover the first alloy portion, the second alloy portion having a thickness in a radial direction smaller than a radius of the first alloy portion, and being made of an aluminum alloy having a tensile strength of 100 MPa to 650 MPa at room temperature.

Elastic member and wire for elastic member

An alloy material includes: a composition, in a composition range of a ternary alloy of silver (Ag), palladium (Pd), and copper (Cu), the composition containing 20 to 30 wt % of Ag, 35 to 55 wt % of Pd, and 20 to 40 wt % of Cu. The composition as a base is added with tin (Sn) in a range of 0.5 to 2.5 wt %, further added with any one of or a combination of cobalt (Co), chromium (Cr), and zinc (Zn) in a range of 0.1 to 1.0 wt %, and added with 0.01 to 0.1 wt % of either one of or a combination of iridium (Ir) and ruthenium (Ru).

Alloy material, contact probe, and connection terminal

A fastening member includes: a first alloy section made of aluminum alloy containing zinc in an amount of 0.005 wt % or more and 6.5 wt % or less and containing magnesium in an amount of 0.6 wt % or more and 2.0 wt % or less, and provided at a portion being in contact with at least one of the plurality of members; and a second alloy section made of an aluminum alloy containing magnesium in an amount of greater than 0.2 wt % and 2.3 wt % or less and containing copper in an amount of greater than 1.0 wt % and 8.0 wt % or less, and bonded to the first alloy section.

Fastening member and rod-shaped member for fastening member

A conductive connection terminal is extensible and compressible in a longitudinal direction, and includes: a first contact member including a first tip portion configured to contact with one electrode of a contact target, and a first base end portion; a second contact member including a second tip portion configured to contact with another electrode of the contact target, and a plurality of tongue parts configured to contact with the first base end portion; an elastic member configured to extend and compress the first contact member and the second contact member in the longitudinal direction; and a load applying unit configured to apply a load to the tongue parts in a direction bringing the tongue parts into contact with an outer circumference of the first base end portion.

Connection terminal

A fastening member includes a first alloy portion and a second alloy portion. The first alloy portion is made of an aluminum alloy including 0.005 wt % to 5.0 wt % zinc and 0.6 wt % to 2.0 wt % magnesium and is provided to a part that comes into contact with at least one of a plurality of members serving as a fastening target. The second alloy portion is made of an aluminum alloy including more than 2.0 wt % and 5.0 wt % or less magnesium and more than 5.0 wt % and 10 wt % or less zinc and is joined to the first alloy portion.

Fastening member and rod-like member for fastening member

A contact probe includes a conductive first plunger including, on a same axis, a distal end portion, a flange portion, a boss portion, and a base end portion, a conductive second plunger including, on the same axis, a second distal end portion and a boss portion, and a coil spring including a coarsely wound portion formed by winding at a predetermined pitch with an inner diameter equal to or larger than a diameter of the boss portion of the first plunger and a tightly wound portion formed by tightly winding with an inner diameter substantially equal to a diameter of the boss portion of the second plunger, so that the first plunger and the second plunger are connected to each other on the same axis.

Contact probe and probe unit

A cylindrical core portion, at least a part of which is made of a noble metal alloy and which has a diameter larger than a maximum diameter of a shape obtained by lathe machining, and a hollow-cylindrical peripheral portion, which is made of a material different from the material of the core portion, are included. The core portion is arranged in a hollow portion of the peripheral portion with no space. The material applied to the peripheral portion is a free-cutting material selected from a group of, for example, free-cutting brass, free-cutting phosphor bronze, free cutting nickel silver, and free-cutting beryllium copper. The noble metal alloy applied to the core portion is, for example, alloy mainly consisting of silver, palladium, gold, platinum, zinc, copper, iron, and nickel, alloy mainly consisting of palladium, silver, and copper, or alloy mainly consisting of silver, platinum, zinc, gold, and copper.

Lathe machining member

A probe-unit base member having high rigidity and requiring no troublesome operations for its manufacture and a probe unit are provided. To achieve the purpose, the probe-unit base member includes a conductive substratethat has a first openingcapable of fitting therein a probe holderand a second openingcommunicated with the first opening; a coatingthat is made of an insulating adhesive agent and is coated at least on an edge of the second opening; and an insulating guide memberthat is bonded to the edge of the second openingthrough the coatingand guides one of two contact bodies to a position in contact with probes

Probe-unit base member and probe unit

A connecting terminal, a semiconductor package, a wiring board, a connector, and a microcontactor that can achieve a stable contact with a contact target are provided. To achieve the object and to establish an electrical connection to a contact target by making a physical contact with the contact target, there are provided a plurality of conductive terminal-forming members each having a terminal portion, which is extended in a band shape and at least a part of a surface of which forms a curved surface. Each terminal portion is configured so that a part of which is laminated on a part of at least one terminal portion in a thickness direction. All the terminal portions may be laminated at respective tip portions in the thickness direction.

Connecting terminals with conductive terminal-forming members having terminal portions extending in different directions

A wiring substrate that allows wiring at a fine pitch and has a coefficient of thermal expansion close to the coefficient of thermal expansion of silicone, and a probe card that includes the wiring substrate are provided. To this end, there are provided a wiring substrate that includes a ceramic substrate having a coefficient of thermal expansion of 3&#xd7;10to 5&#xd7;10/&#xb0; C. and one or more thin-film wiring sheets stacked on one surface of the ceramic substrate, and a probe head on which a plurality of conductive proves are arranged in accordance with wiring on the thin-film wiring sheet, which holds individual probes while preventing the probes from coming off and allowing both ends of each probe to be exposed, and which is stacked on the wiring substrate while one end of each probe is brought into contact with the thin-film wiring sheet.

Wiring substrate and probe card

A probe unit includes: large diameter probes; small diameter probes; a large-diameter probe holder having large hole portions which individually hold the large diameter probes, and reception hole portions which have diameters smaller than those of the large hole portions, communicate with the large hole portions, and receive end portions of the small diameter probes so that the end portions come into contact with the large diameter; and a small-diameter probe holder probes having small hole portions which individually hold the small diameter probes. The central axes of the large hole portion and the small hole portion that communicate with each other are separated from each other, and the small hole portions include two small hole portions which are adjacent to each other and of which central axes are separated from each other by a distance shorter than a distance between the central axes of two large hole portions that are corresponding to the two small hole portions.

Probe unit

A method for manufacturing a conductive contact holder includes forming, from an insulating material, a holder member for holding a plurality of conductive contacts; forming, from a conductive material, a substrate having a hollow portion to which the holder member can be fitted; and fixing the holder member formed from the insulating material by fitting the substrate into the hollow portion of the substrate formed from the conductive material.

Method for manufacturing conductive contact holder, and conductive contact holder

In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers () biased in opposite directions by a coil spring (), to be electrically connected to a wiring plate (), have electrical connections in which, in a tubular portion () as a tight wound spiral portion () fixed on one plunger () to allow linear flow of electrical signal, the other plunger () is brought into slidable contact.

Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit

A shape of a cross-section perpendicular to a longitudinal direction of a main body section of a conductive contact is anisotropic.

Growing community of inventors

Nagano, Japan

Toshio Kazama