Konica Minolta, Inc.

Konica Minolta Sensing, Inc.

Toshio Kawano

Takashi Kawasaki

Yoshiroh Nagai

Yoshihisa Abe

Koji Nagai

Toru Nakatani

Masayuki Yamada

Hitoshi Nagasawa

Yushi Nobumoto

A spectral device is provided with: a filter having a property of transmitting light of multiple wavelength ranges from a measurement object; a driving means to slide the filter; and a detector to detect an intensity of the light from the measurement object, the light having passed through the filter, the detector to further measure the intensity of the light multiple times sequentially while the driving means slides the filter and thereby obtain multiple pieces of measured data to be used for a calculation of spectral information.

Spectral device

Creating a model calibrating spectral apparatus having an optical system that converts light to be measured into a spectrum, and a light-receiving sensor including a plurality of sensors that outputs signals, the sensors include sensors that output signals indicating respective energy amounts of a plurality of wavelength components. The model shows where a linear function of an indicator indicating a mechanical error in the spectral apparatus, expresses deviation of an indicator indicating spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor. The method comprises: a) acquiring reference spectral sensitivity; b) acquiring an indicator indicating the reference spectral sensitivity of the sensor acquired at a); and c) creating the model where the linear function of the mechanical error indicator expresses deviation of the spectral sensitivity indicator from the indicator indicating the reference spectral sensitivity of the sensor, acquired at b).

Method of calibrating spectral apparatus and method of producing calibrated spectral apparatus

Spectral apparatus includes sensors that output signals indicating the respective energy amounts of a plurality of wavelength components. For each of the sensors, its reference spectral sensitivity is acquired, and an indicator indicating the reference spectral sensitivity of the sensor, is acquired. The deviation of an indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is expressed by a linear function of an indicator indicating a mechanical error in the spectral apparatus. The indicator indicating the mechanical error in the spectral apparatus, is acquired to adapt a spectral sensitivity set of sensors to a signal set output by the sensors. For each of the sensors, the deviation of the indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is acquired, so that the spectral sensitivity of the sensor is acquired.

The reflection characteristic measuring device according to the present invention is a device that includes a diffuse reflecting surface and measures a plurality of mutually different types of reflection characteristics by using a plurality of optical systems having mutually different geometries, which corrects the reflection characteristics to be measured by an error generated when light emitted from an object of measurement is reflected from the diffuse reflecting surface and illuminates the object of measurement. The reflection characteristic measuring device according to the present invention is therefore capable of reducing errors resulting from recursive diffused illumination.

Reflection characteristic measuring device

A multi-angle optical characteristic measuring device and an optical unit therefor include: an illuminating portion that irradiates a measurement point with an illuminating light beam; a plurality of reflecting mirrors that are arranged facing the measurement point at a plurality of different observation angles, and modify traveling directions of measurement light beams emitted from the measurement point in response to the illuminating light beam; one light receiving optical system that receives the measurement light beams from the plurality of reflecting mirrors; and a two-dimensional detecting portion that detects the measurement light beams received by the light receiving optical system, and the plurality of reflecting mirrors modifies the traveling directions of the measurement light beams such that the two-dimensional detecting portion detects the measurement light beams at different positions on the two-dimensional detecting portion.

Optical unit for multi-angle optical characteristic measuring device, and multi-angle optical characteristic measuring device

In a gloss evaluation method and a gloss evaluation apparatus according to the present invention, an intensity P of specular light obtained by illuminating an object to be measured with illumination light of spectral irradiance emitted from the reference machine is obtained from an intensity of specular light obtained by illuminating the object to be measured with first illumination light of spectral irradiance from a relevant machine, based on an intensity b of dispersed reflected light obtained by illuminating the object to be measured with the first illumination light, and a spectral reflectance of diffuse reflection light obtained by illuminating the object to be measured with predetermined second illumination light from a different illuminating angle.

Gloss evaluation method and gloss evaluation device

A Fourier transform spectrometer (Da) of the invention extracts, in generating an integrated interferogram obtained by integrating a plurality of interferograms, an output of an interferometer () within a predetermined range according to positioning information of a center burst in an interferogram measured at a time before measurement of an interferogram at the present time.

Fourier transform spectrometer and fourier transform spectroscopic method

A method is provided for controlling display of three-dimensional data in a three-dimensional processor that processes three-dimensional data indicating three-dimensional position coordinates of each point on a surface of an object to be measured, the three-dimensional data being obtained by projecting measurement light onto the object and receiving measurement light reflected from the object. The method includes obtaining reliability data that are an index of reliability of three-dimensional data of said each point, enabling a user to adjust a threshold for defining a range of the reliability, and displaying, on a screen of a display, three-dimensional data corresponding to reliability falling within a range defined by the threshold adjusted by the user with the three-dimensional data displayed distinguishably from different three-dimensional data.

Three-dimensional processor and method for controlling display of three-dimensional data in the three-dimensional processor

In three-dimensional measurement where circular polarized light or elliptical polarized light is projected as measurement light, correct measurement results can be obtained irrespective of the difference in intensity between primary reflected light and secondary reflected light. A three-dimensional position measurement method includes projecting, as the measurement light, circular polarized light or elliptical polarized light onto an object to be measured, photoelectrically converting reflected light from the object to obtain a first signal, allowing the reflected light from the object to enter a quarter wavelength plate, allowing reflected light that has passed through the quarter wavelength plate to enter a polarizing device attenuating secondary reflected light that is light reflected from the object twice, photoelectrically converting reflected light that has passed through the polarizing device to obtain a second signal, and removing secondary reflected light components by using a difference between the first signal and the second signal.

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Sakai, Japan

Toshio Kawano