Hitachi-high-technologies Corporation

Hitachi Electronics Engineering Co., Ltd.

Toshinori Sugiyama

Kyoichi Mori

Yoshinori Tokumura

Shigeo Nakamura

Yasuhiro Matsuda

Hideki Mochizuki

Fujio Yamasaki

Shinji Honma

Kimihiko Sudo

Teruaki Tokutomi

Yoshihiro Sakurai

Yukio Yamamoto

Toshiaki Suzuki

Syoji Tsuyuki

Shinji Kawamoto

A magnetic head-positioning system to accurately test a magnetic disk and a magnetic head, comprises a plurality of hinges attached on an end portion of a linear driving element and disposed on both sides of a center line of the linear driving element, which is in parallel with an extension-shrinkage direction of the linear driving element, and an arm having a length longer than a distance between a plurality of hinge joint portions, the plurality of the hinge joint portions each of which join the hinge with a root portion of the arm and which are disposed on both sides of a center line of the arm which is in parallel with a longitudinal direction of the arm. The arm has an extremity portion on which a head gimbal assembly is detachably attached and this head gimbal assembly is positioned.

Position determining system with arm center line crossing expanding/contracting direction of hinged actuator unit

An upward warp of a terminal pad of a flexible cable which is kept horizontal by a suction head is prevented by a pressing arm which contacts with an upper surface of a rear portion of the flexible cable.

Handling robot of magnetic head assembly, magnetic head test method and magnetic head tester

A magnetic head-positioning servo system is provided to accurately test a magnetic disk with a track written in advance, by providing two fine actuators. The second fine actuator, to which a magnetic head is attached, is mounted on the first fine actuator. The second fine actuator has a larger generating displacement than a generating displacement of the first fine actuator, and lets the magnetic disk to follow the eccentricity of the track. In this way, the positioning accuracy can be increased.

Magnetic head-positioning servo system, magnetic head test system and magnetic disk test system

In the present invention, through the provision of a tray placing rack for storing trays in multi steps, the trays accommodating electronic parts after inspection are received in the racks and through the provision of a tray stacking rack above the tray placing rack, an empty tray emptied by having been inspected of the electronic parts before inspection at an inspection stage is stacked on the tray stacking rack. When a certain tray is filled with electronic parts after inspection and is discharged, an empty ray is taken out from the tray stacking rack and the empty tray is fed to the rack position of the discharged tray to permit re-use of empty trays.

Handling mechanism of trays with which electronic parts are fed and inspection device of the electronic parts using the mechanism

A magnetic head assembly having a mounting base in which a mounting hole having a protruded peripheral edge is formed is easily mounted on a head clamp table positioning the magnetic head assembly by fitting the mounting hole on a boss pin or a receiving hole of a tray, with a pin or a hole on a mounting table and with a positioning pin on a head clamp table and positioning a suction collet with using a boss pin or a receiving hole of a tray as references, and sucking the mounting base of the magnetic head assembly by a handling robot without requiring high positioning accuracy.

Magnetic head test method and magnetic head tester

Pressing means is provided to press a movable base to a surface of a reference base to make the movable base in contact with the surface of the reference base to thereby lock-down the movable base on the surface of the reference base. The movable base is moved while slightly floating with respect to the reference base. A movable floating mechanism is provided to float the movable base from the reference base against pressing force of the pressing means exerted on the movable base to thereby relieve the locking. A floating amount of the movable base from the reference base may be small enough to reduce or substantially remove sliding friction between the movable base and the reference base. For example, the floating amount may be as small as ten to several hundreds microns.

Movable stage, XY stage, head carriage and tester of magnetic head or magnetic disk

An XY stage includes a movable frame having a rectangular space inside thereof and movable on a reference base along one of X and Y axes, a first drive source provided in the reference base for moving the movable frame, a rectangular movable base mounted in the rectangular space of the movable frame, which is movable on the reference base along the other of the X and Y axes and stopped on the reference base, and a second drive source provided in the movable frame, for moving the movable base.

XY stage, head carriage and tester of magnetic head or magnetic disk

The improved for measuring the flying height of a magnetic head comprises a clear disk made of single-crystal sapphire, a spindle on which said disk is mounted for rotation, a mechanism for loading the magnetic head above one surface of said disk, measuring optics having a photoelectric converter that receives the light produced by interference of reflected light from said one surface of said disk with reflected light from the surface of said magnetic head as a result of application of light to said one surface through the other surface of said disk, and which converts the received interference light to an electric signal by means of said photoelectric converter, and a processing unit for calculating the flying height of said magnetic head in response to said electric signal from said measuring optics.

Growing community of inventors

Ashigarakami-gun, Japan

Toshinori Sugiyama