Canon Kabushiki Kaisha

Jfe Steel Corporation

Toshiki Tsuboi

Naoshi Yamahira

Takeshi Ichikawa

Akira Okita

Yosuke Nishide

Hiroshi Yoshioka

Nao Nakatsuji

Takehide Hirata

Kazuro Tsuda

Takahiro Nishino

Masahiro Kobayashi

Yusuke Onuki

Fumihiro Inui

Kazuyuki Shigeta

Takeru Ohya

Takashi Muto

Kazunari Kawabata

Hisashi Takado

Satoru Shingai

Shoji Takada

Yuta Okabe

Yoshifumi Kobashi

A fine ratio measuring method and apparatus. The fine ratio measuring method includes a step S1 of measuring a distance between a distance measuring device and lumps of material, a step S2 of calculating a feature quantity from distance data obtained in the step S1, and a step S3 of converting the feature quantity calculated in step S2 to a fine ratio. The feature quantity calculated in step S2 represents distance variation calculated from the distance data obtained in the step S1. A higher fine ratio in lumps of material means greater microscopic distance variation caused by microscopic irregularities in the surface of the lumps of material in the height direction within a three-dimensional shape. Therefore, by using the distance variation as the feature quantity, the fine ratio in the lumps of material can be measured in real time with high accuracy.

Fine ratio measuring method and apparatus

An imaging unit includes a plurality of photoelectric conversion elements, a processing unit, and a display unit. The processing unit processes a signal transmitted from the imaging unit. The display unit displays an image based on the signal transmitted from the processing unit. The imaging unit acquires first image information at a first time. The processing unit generates first prediction image information at a second time later than the first time based on the first image information. Moreover, the display unit displays an image based on the first prediction image information.

Imaging display device, wearable device, and imaging display system

A system includes one or more edge devices an integrated management apparatus configured to manage the one or more edge devices. The edge devices include a photodetector. The integrated management apparatus manages a first trained model and a first condition in association with each other. The first condition sets a condition for a photodetector used in generating the first trained model. The integrated management apparatus is configured to deliver the first trained model and the first condition to the edge devices.

System and edge device

A fine ratio measuring device that measures a ratio of fines adhering to the surface of a material in the form of lumps, the fine ratio measuring device includes: an illumination unit that illuminates the material in the form of lumps; a spectrometer that performs spectral analysis on light reflected from the material in the form of lumps to measure spectral reflectance; and an arithmetic device that extracts at least one feature quantity from the spectral reflectance measured by the spectrometer and computes the fine ratio from the extracted at least one feature quantity.

Fine ratio measuring device, fine ratio measuring system, and blast furnace operating method

A fine ratio measuring device that measures the fine ratio of fines adhering to the surface of the material in the form of lumps includes: an illumination unit that illuminates the material in the form of lumps; an imaging unit that captures an image of the material in the form of lumps and produces image data; and an arithmetic unit including a computation unit that computes a characteristic quantity of the image data produced by the imaging unit and a conversion unit that converts the characteristic quantity computed by the computation unit to the fine ratio.

Fine ratio measuring device and fine ratio measuring system

Provided are a raw material particle size distribution measuring apparatus and a particle size distribution measuring method. Also provided is a porosity measuring apparatus. The raw material particle size distribution measuring apparatus includes: a coarse particle measuring device that acquires information indicating the particle size distribution of the coarse particles; a fine particle measuring device that acquires information indicating the particle size distribution of the fine particles; and an arithmetic device that computes the particle size distribution of the coarse particles using the information indicating the particle size distribution of the coarse particles, computes the particle size distribution of the fine particles using the information indicating the particle size distribution of the fine particles, and computes an overall particle size distribution of the raw material using the particle size distribution of the coarse particles and the particle size distribution of the fine particles.

Raw material particle size distribution measuring apparatus, particle size distribution measuring method, and porosity measuring apparatus

A particle size distribution measurement apparatus includes a coarse grain measurement device that acquires information indicating distribution of coarse grains, an adherent powder measurement device that acquires information indicating distribution of adherent powder, and a computation device that calculates distribution of a raw material. The computation device includes a coarse grain particle size distribution calculation unit configured to calculate the distribution of the coarse grains on the basis of the information acquired by the coarse grain measurement device, an adherent powder particle size distribution calculation unit configured to calculate the particle size distribution of the adherent powder on the basis of the information acquired by the adherent powder measurement device, and a raw material particle size distribution calculation unit configured to calculate the particle size distribution of the raw material on the basis of the distribution calculated by the coarse grain and adherent powder particle size distribution calculation units.

Particle size distribution measurement apparatus and particle size distribution measurement method

In a state where an electric charge is held in a first charge holding unit, starting accumulation of an electric charge in a photoelectric conversion unit simultaneously in a plurality of pixel rows, and performing a first transfer operation for transferring an electric charge from the photoelectric conversion unit to the first charge holding unit simultaneously in the plurality of pixel rows.

Method for driving imaging apparatus

An imaging apparatus according to an exemplary embodiment includes pixels, reading circuits, first current sources each including a first transistor, second current sources each including a second transistor, a first control unit configured to control outputting a current from the first transistor to the reading circuit, and a second control unit configured to perform selectively supplying a voltage to a gate of the second transistor and holding a voltage at the gate of the second transistor. When the second control unit supplies the voltage to the gate of the second transistor, the second transistor supplies the reference current and the first control unit stops outputting the current from the first transistor to the reading circuit. When the second control unit holds the voltage at the gate of the second transistor, the first control unit causes the first transistor to output the current from the first transistor to the reading circuit.

Growing community of inventors

Tokyo, Japan

Toshiki Tsuboi