Sysmex Corporation

Toshihisa Tanaka

Noriyuki Nakanishi

Hiroo Tatsutani

Yuichiro Ohmae

Seiya Shinabe

Tetsuya Oda

Shogo Kubota

Kei Takai

Hiroyuki Koga

Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying processing section configured to dry a specimen on the glass slide on which the first process and the second process have been performed, wherein one of the first processing section and the second processing section is configured to perform a smearing process for smearing a specimen on the glass slide.

Specimen smearing apparatus, specimen smearing method, smear sample preparing apparatus, and smear sample preparing method

A sample processing apparatus comprises a transporting section configured to transport a sample rack that is capable of holding a sample container at a plurality of holding positions, a detecting section that is configured to detect presence or absence of a rack distinction member at a holding position of the sample rack, an aspirating section that is configured to aspirate a sample in the sample container, and a control section that is configured to control an aspirating operation of the aspirating section. The control section changes an aspirating operation with respect to the sample container held in the sample rack based on the presence/absence of the rack distinction member at the holding position of the sample rack.

Sample processing apparatus, sample rack set, and sample processing method

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Kobe, Japan

Toshihisa Tanaka