Hitachi, Ltd.

Hitachi-High-Technologies Corporation

Toshihiro Ishizuka

Munetaka Tsuda

Yasuo Wada

Masaru Tomioka

Masao Yabusaki

Hideaki Koizumi

Yasuaki Takada

Etsuji Yamamoto

Minoru Sakairi

Hideki Kohno

Kiyomi Yoshinari

Tadao Mimura

Takayuki Nabeshima

Yoshiki Murakami

Tomoyuki Tobita

Ryuzaburo Takeda

Takayuki Shimizu

Masami Sakamoto

Minoru Saito

In a mass spectrometer utilizing an atmospheric pressure ion source, the amount of un-vaporized droplets that reach a mass spectrometric section is reduced. A mass spectrometer comprises: an ionization section for ionizing a sample at substantially atmospheric pressure; a first and a second intermediate pressure section in which the pressure is maintained lower than the pressure in said ionization section; a high vacuum section in which the pressure is maintained lower than the pressure in said intermediate pressure section and in which a mass spectrometric means for subjecting ions to mass spectrometry is disposed; a first pore electrode disposed between said ionization section and said first intermediate pressure section; an intermediate pore electrode disposed between said first intermediate pressure section and said second intermediate pressure section; and a second pore electrode disposed between said second intermediate pressure section and said high vacuum section. A first converging electrode is provided in the first intermediate pressure section, the first converging electrode having an opening towards the first pore electrode and another opening towards the intermediate pore electrode. The opening towards the first pore electrode has a larger diameter than the opening towards the intermediate pore electrode, such that the first converging electrode has a tapered shape.

Mass spectrometer

Disclosed is an ion trap mass spectrometer improved to obtain a high sensitivity without the lowering of resolution. By fitting a mesh electrode to an aperture (an ion sampling aperture or an ion extracting aperture) made in endcap electrodes constituting an ion trap mass analysis region, a radio frequency electric field in the mass analysis region is not disturbed even if the diameter of the aperture is set to a large value to heighten ion transmission efficiency. By fitting a shield electrode for preventing collision of ions with an insulated ring constituting an outer wall of the mass analysis region, charging up of the insulated ring is prevented to improve stability of detection signals. Furthermore, by arranging a shield member for shielding stray charged particles detouring through the circumference of the mass analysis region to approach an ion detector, generation of noises based on these stray charged particles is prevented.

Ion trap mass spectrometer

In an MR imaging apparatus, a receiving coil comprising an upper coil and a lower coil which jointly sandwitch a desired part of a body to be inspected in an openable and closable manner, the upper and the lower coils being connected by connection means comprised of flexible and electrically conductive member to form a single coil. NMR signals can be detected at a high sensitivity, enabling an image of a high S/N ratio and measurement of a wide detection region.

Magnetic resonance imaging apparatus

A quadrature detection device for magnetic resonance imaging includes a pair of probes each having a pair of first conductors with a vertical arm and wings formed at both ends of the vertical arm and guard rings disposed inside the wings to oppose them and predetermined capacitors. In each probe, the resonance characteristics of the probe has two peaks. Symmetry of the peak existing in the resonance frequency range is effected by spacing the peak existing in a frequency range other than the resonance frequency range apart from the former. Thus, uniformity of the resulting image can be improved. The drop of the Q value of the probe is prevented by shifting the former peak to a higher frequency range than the latter peak. Also, electric symmetry of the probe is maintained.

Probe for magnetic resonance inspection apparatus

In a nuclear magnetic resonance imaging apparatus including a first probe circuit for detecting magnetic flux in a first direction and a second probe circuit for detecting magnetic flux in a direction perpendicular to the first direction, the arm angle of conductor arms to form the first probe circuit and the arm angle of conductor arms to form the second probe circuit are different from each other.

Nuclear magnetic resonance imaging apparatus

Method of selecting specific region of sample

Growing community of inventors

Katsuta, Japan

Toshihiro Ishizuka