Ricoh Company, Ltd.

Nissan Chemical Industries Limited

Advanced Telecommunications Research Institute International

Nissan Engineering Ltd.

Toshihiro Ishii

Satoru Sugawara

Fumikazu Hoshi

Yoshihiro Oba

Shunichi Sato

Yoshihiro Ohba

Kazuhiro Harasaka

Kazuhiko Adachi

Yoichiro Takahashi

Toshihide Sasaki

Masayuki Fujiwara

Kengo Makita

Naoto Jikutani

Yukimichi Someya

Takuro Sekiya

Yasuo Katano

Naomi Sugimoto

Akihiro Itoh

Masahiro Hayashi

Eiichi Ohta

Hiroyoshi Shouji

Sunao Chubachi

Shohji Tanaka

Takeaki Shimokawa

Yoshihiko Iijima

Masaaki Sato

Hiroshi Nakagawa

Fumie Sato

Misao Miyamoto

Kazuma Goto

Yoshihiro Misaka

Okito Yamashita

Kenichi Osawa

Hideo Kawasaki

Masaji Nakatani

Hiroshi Takaya

Akira Hirao

Seiichi Nakahama

An optical sensor includes a light source; and an optical detector detecting intensity of light that is reflected by a recording medium, the light from the light source and irradiated onto the recording medium. Further, when an incident angle of the light incident to the recording medium from the light source relative to a normal line of the recording medium is given as &#x3b8;, a formula 75&#xb0;&#x2264;&#x3b8;&#x2264;85&#xb0; is satisfied.

Optical sensor and image forming apparatus

An optical sensor includes a light emitter configured to irradiate a surface of an object with a plurality of non-parallel light beams, a light detector configured to detect a plurality of light beams that have been reflected within the object and have returned to the surface from a plurality of directions, a recording unit configured to store pre-calculated results of a plurality of models having different optical properties and physical structures, and a calculating unit configured to calculate a light amount ratio of the plurality of reflected light beams, and estimate an optical property of the object based on the calculated light amount ratio and the pre-calculated results.

Optical sensor

An optical sensor includes a light source; and an optical detector detecting intensity of light that is reflected by a recording medium, the light from the light source and irradiated onto the recording medium. Further, when an incident angle of the light incident to the recording medium from the light source relative to a normal line of the recording medium is given as &#x3b8;1, a formula 75&#xb0;&#x2264;&#x3b8;1&#x2264;85&#xb0; is satisfied.

A method of performing an optical examination on a test object and an optical examination device. The method includes obtaining a first detection light quantity distribution that is a detection light quantity distribution obtained for each of a plurality of optical models that simulate the test object, obtaining, using the optical sensor, a second detection light quantity distribution that is a distribution of an amount of light detected on the test object, and selecting based on the first light quantity distribution and the second detection light quantity distribution, an optical model suited to the test object from the plurality of optical models. The optical examination device includes an optical sensor, and a control system to control the irradiation system to obtain an amount of light detected by the detection system.

Optical examination method and optical examination device

An optical sensor, an optical examination device, and a method of detecting optical properties. The optical sensor includes an irradiation system including light irradiator to irradiate a test object with light, and a detection system to detect the light that is emitted from the irradiation system to the test object and has propagated through the test object. The light irradiator includes a multilayered structure having an active layer, and the multilayered structure includes a surface-emitting laser element and a photo-sensing element optically connected to the surface-emitting laser element. The optical examination device includes the optical sensor, and a controller to calculate optical properties of the test object based on a detection result of the optical sensor. The method includes performing optical simulation to obtain a detection light quantity distribution for an optical model and performing inverse problem estimation.

Optical sensor, optical examination device, and optical property detection method

An optical sensor is provided. The optical sensor has an emitting system including at least one light emitting device which emits light onto an object; and a detecting system detecting the light which has been emitted by the emitting system and which has propagated through the object. The light emitting device is capable of emitting a plurality of light beams with different wavelengths onto substantially the same position of the object.

Optical sensor, optical testing apparatus, and optical characteristics detection method

An optical sensor including an irradiation system including at least one light irradiator, the at least one irradiator including a surface emitting laser array having a plurality of light-emitting units, and a lens disposed in an optical path of the plurality of rays of light emitted from the plurality of light-emitting units to cause light exit directions of at least two of the plurality of light-emitting units to be not parallel to each other, such that the at least one irradiator irradiates a same point of a test object with a plurality of rays of light that are not parallel to each other. The optical sensor also including a detection system configured to detect the plurality of rays of light that are emitted from the irradiation system and propagated inside the test object.

Optical sensor, optical inspection device, and optical property detection method for detecting light propagated inside a test object

An optical sensor includes an irradiation system including at least one light irradiator to irradiate light onto an object under test; and a detection system detecting the light that is irradiated from the irradiation system and is propagated in the object under test. Further, the light irradiator irradiates non-parallel plural light beams on a same position of the object under test.

Optical sensor, optical testing device, and optical characteristic detection method

A disclosed surface-emitting laser module includes a surface-emitting laser formed on a substrate to emit light perpendicular to its surface, a package including a recess portion in which the substrate having the surface-emitting laser is arranged, and a transparent substrate arranged to cover the recess portion of the package and the substrate having the surface-emitting laser such that the transparent substrate and the package are connected on a light emitting side of the surface-emitting laser. In the surface-emitting laser module, a high reflectance region and a low reflectance region are formed within a region enclosed by an electrode on an upper part of a mesa of the surface-emitting laser, and the transparent substrate is slanted to the surface of the substrate having the surface-emitting laser in a polarization direction of the light emitted from the surface-emitting laser determined by the high reflectance region and the low reflectance region.

Surface-emitting laser module, optical scanner device, and image forming apparatus

An optical sensor includes a light source; and an optical detector detecting intensity of light that is reflected by a recording medium, the light from the light source and irradiated onto the recording medium. Further, when an incident angle of the light incident the recording medium from the light source relative to a normal line of the recording medium is given as &#x3b8;, a formula 75&#xb0;&#x2266;&#x3b8;&#x2266;85&#xb0; is satisfied.

In an optical sensor, a light emission system emits an irradiated light of a linear polarization in a first polarization direction toward a surface of a target object having a sheet shape from an incident direction which is inclined with respect to a normal direction of the surface. A first light detection system includes a first light detector arranged on a first light path of a specular reflected light, which is emitted from the light emission system and is specularly reflected from the target object. A second light detection system includes a second light detector arranged on a second light path of a diffuse reflected light which is diffusely reflected from an incident plane on the target object. The second light detector receives second light passed by an optical element which passes a linear polarization component of a second polarization direction perpendicular to the first polarization direction.

An optical sensor includes a light source to illuminate a linear polarization in a first direction, a first optical detector disposed on a path of a light illuminated from the light source and specularly reflected by an object, a first optical element to separate the light reflected by the object into a linear polarization in the first direction and a linear polarization in a second direction orthogonal to the first direction, a second optical detector to receive the linear polarization in the second direction separated by the first optical element, and a processor to obtain an amount of the light specularly reflected by the object on the basis of an output signal of the first optical detector and an output signal of the second optical detector.

Optical sensor and image forming device incorporating the same

A sensor apparatus includes an irradiation system with a light source configured to emit linearly polarized light of a first polarization direction onto a sheet-like object, in a direction oblique to a direction orthogonal to a surface of the object, a first photodetector arranged on an optical path of light that is emitted from the irradiation system and then is reflected at the object by regular reflection, a first optical element, arranged on an optical path of light reflected by diffuse reflection from an incidence plane of the object, configured to transmit linearly polarized light of a second polarization direction that is orthogonal to the first polarization direction, a second photodetector configured to receive light that has passed through the first optical element, and a detection unit configured to detect at least one of basis weight and thickness of the object.

Sensor apparatus and image forming apparatus incorporating same

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Miyagi, Japan

Toshihiro Ishii