Hitachi, Ltd.

Toshihiko Sakaide

Shigeru Matsui

Masahito Ito

Yoshio Fujii

In order to suppress base line drift due to change in a light source and to start analysis with a short waiting time so as to improve quantitative accuracy of analysis, a detected signal in a measurement wavelength and a detected signal in a reference wavelength are measured at each of arbitrary light intensity points by varying light intensity of a light source, and the corresponding relationship between the wavelengths is stored. An incident light intensity of the measurement wavelength is estimated from a detected signal in the reference wavelength based on the stored data.

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Hitachinaka, Japan

Toshihiko Sakaide