Average Co-Inventor Count = 3.21
ph-index = 10
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Hitachi-high-technologies Corporation (80 from 2,872 patents)
2. Hitachi High-tech Corporation (20 from 1,062 patents)
3. Hitachi, Ltd. (10 from 42,443 patents)
4. Other (2 from 832,347 patents)
5. The University of Tokyo (1 from 1,265 patents)
112 patents:
1. 12422377 - Defect inspection apparatus and defect inspection method
2. 12400889 - Defect inspection device
3. 12366538 - Defect inspection apparatus and defect inspection method
4. 12366443 - Surface inspection device and shape measurement software
5. 12345654 - Defect inspection device, defect inspection method, and adjustment substrate
6. 12313566 - Defect inspection device and defect inspection method
7. 12292389 - Defect inspection apparatus
8. 12196673 - Defect inspection apparatus and defect inspection method
9. 12146840 - Defect inspection device
10. 12044627 - Defect inspection device and defect inspection method
11. 12025569 - Defect inspection device and inspection method, and optical module
12. 11442024 - Defect classification device, inspection device, and inspection system
13. 11346791 - Inspection device and inspection method thereof
14. 11143598 - Defect inspection apparatus and defect inspection method
15. 11143600 - Defect inspection device