Canon Kabushiki Kaisha

Toshiaki Takahashi

Kazuhiko Hara

Masato Nagura

In an ultrasonic imaging apparatus, an object to be inspected is scanned while being irradiated by a generated ultrasonic beam. Echo signals from the object are received and a plane image and a cross-sectional image formed from the received echo signals are displayed. A marker indicating the focus position of the ultrasonic beam and a marker indicating the setting range of a detection gate are synthesized and displayed on the cross-sectional image. The plane image of the portion assigned by the focus position and the depth range on the cross-sectional image is obtained.

Ultrasonic imaging apparatus with synthesized focus and setting range

Ultrasonic apparatus that automatically adjusts the focus of ultrasonic waves to a desired depth within an object includes an ultrasonic probe which irradiates a focused ultrasonic beam onto an object to be inspected and a receiver which receives ultrasonic waves reflected from the object. A desired focusing depth is set and the inherent focal length of the probe and the velocity of sound within the object are detected to evaluate a distance between the probe and the object at which the focus of the probe coincides with the desired depth. The distance between the probe and the object is adjusted to coincide with the evaluated distance.

Ultrasonic apparatus

An ultrasonic measuring method and an ultrasonic measuring apparatus utilize the level of a reflected ultrasonic reception signal coming from an object to be examined as measurement data after the level has been provided with either a positive or a negative sign in accordance with the phase of the reception signal.

Ultrasonic measuring apparatus for measuring a predetermined boundary

Disclosed is an element characteristic measuring apparatus provided with a first illuminating system for uniformly illuminating the whole area of an element, a second illuminating system for providing an imaging illumination to a part area of the element, and an output detector for detecting the output of the illuminated element.

Growing community of inventors

Tachikawa, Japan

Toshiaki Takahashi