Nec Corporation

Hymo Corporation

Toshiaki Sugiyama

Motosuke Ono

Osamu Kamada

There is provided a treating agent for a sheet surface comprising a graft copolymer composed of a back bone polymer and branch polymer, either of which is a polymer having vinyl alcohol units, and the other of which is a polymer having cationic groups, the treating agent is applied onto a pulp sheet or plastic sheet, and the coated sheet is used in ink jet printing. Cationic groups are introduced by graft copolymerization using di(meth)allylamine-based and/or (meth)acryl-based monomer. Alternatively, the graft copolymer of the present invention is obtained by grafting N-vinylcarboxylic acid amide monomer followed by hydrolysis thereof. A formula weight ratio of vinylalcohol units and the introduced cationic groups of 1:20 to 2:1 is preferable in terms of balanced performance.

Sheet surface treating agent and ink-jet printing paper

The invention provides a novel scanning control system of preventing any over-scanning involved in an ion-implantation apparatus accomplishing an electrostatic X-scanning and a mechanical Y-scanning. The system includes a liner detecting arrangement for detecting over-scanning comprising a horizontal and sequential alignment of plural Faraday tubes. The detecting arrangement having a larger length than a diameter of a wafer is located behind the wafer mounted on a platen. The system also includes an X-scanning width control feature which is electrically connected to the detecting arrangement to fetch results of over-scanning detection. The X-scanning width control feature is determinative of a frequency of X-scanning associated with a width of X-scanning and supplies X-scanning frequency control voltage signals to X-deflector electrode plates making a pair thereby preventing over-scanning. The system further includes a Y-scanning speed control feature for controlling a speed of Y-direction movement of the wafer according to the frequency of the X-scanning thereby securing an uniformity of ion-implantation to the wafer.

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Tokyo, Japan

Toshiaki Sugiyama