Mitsubishi Denki Kabushiki Kaisha

Toshiaki Ogawa

Kenji Kawai

Moriaki Akazawa

Hiroshi Morita

Takahiro Maruyama

Tomoaki Ishida

Yoshinori Tanaka

Toshiaki Iwamatsu

Takashi Ipposhi

Shinya Watanabe

Natsuo Ajika

Kazuyuki Sugahara

Mitsuya Kinoshita

Tatsuo Kasaoka

Takahiro Hoshiko

Nobuo Fujiwara

Teruo Shibano

Kyusaku Nishioka

A contact hole having an opening diameter smaller than the minimum dimension that can be formed by photolithographic technique is formed. Using an interlayer insulating film formed on a semiconductor substrate as an etching mask, etching is carried out halfway to form an opening . The etching mask is removed, and a TEOS film is formed on the interlayer oxide film . The whole surface is then etched anisotropically to form a contact hole

Semiconductor device and a method of manufacturing thereof

A contact hole having an opening diameter smaller than the minimum dimension that can be formed by photolithographic technique is formed. Using an interlayer insulating film 8 formed on a semiconductor substrate as an etching mask, etching is carried out halfway to form an opening 8a. The etching mask is removed, and a TEOS film 10 is formed on the interlayer oxide film 8. The whole surface is then etched anisotropically to form a contact hole 11.

A method of manufacturing a semiconductor device includes forming a first insulating layer on a major surface of a semiconductor substrate. The first insulating layer has an opening located at a predetermined position on and reaching the major surface of the substrate. A first conductive layer is formed in the opening and in contact with the surface of the first insulating layer. A second insulating layer is formed on a predetermined region of the first conductive layer. A second conductive layer is formed to cover at least the second insulating layer. The second conductive layer is removed from at least an upper surface of the second insulating layer to expose the upper surface thereof. The exposed upper surface of the second insulating layer is etched to partially remove a predetermined thickness of the second insulating layer. The second conductive layer is sputter-etched with inert gas to substantially round the tip and flatten a side surface thereof. A capacitor insulating layer is formed to cover the second conductive layer after removing the residual second insulating layer. A third conductive layer is formed to cover the capacitor insulating layer. The sputter-etching of the second conductive layer results in a side surface roughness of the second conductive layer of no more than 200 .ANG..

Method of manufacturing a semiconductor memory device having a capacitor

Disclosed are a semiconductor device having a sidewall insulating film free from the formation of fence-shaped residue when a conductive layer formed on the sidewall insulating film is anisotropically etched by means of plasma etching, and a method of forming the sidewall insulating film. The method of forming the sidewall insulating film includes the steps of isotropically etching an insulating film 4 formed on a polycrystalline silicon film 3 to be a gate electrode as much as a prescribed thickness, using resist as a mask, anisotropically etching the remaining part of insulating film 4 and polycrystalline silicon film 3, forming an insulating film 6 entirely over the surface, and forming a sidewall insulating film 6a on the side plane of polycrystalline silicon film 3. The resultant sidewall insulating film 6a has a cross-section reduced upwardly in width. A polycrystalline silicon film 7 formed on sidewall insulating film 6a will not have a surface in the vertical direction relative to a semiconductor substrate 1. Consequently, the disconnection of an upper layer interconnection can be effectively prevented, and miniaturization of elements can be achieved without forming fence-shaped residue, when polycrystalline silicon film 7 is anisotropically etched (plasma etching).

Manufacturing method of sidewall insulating film

In a method of manufacturing a stacked-type semiconductor device, firstly, a first semiconductor substrate having a first device formed thereon is covered with an interlayer insulating layer and a planarized polycrystalline silicon layer is formed on the interlayer insulating layer. The first semiconductor substrate and a second semiconductor substrate are joined together by putting the surface of the polycrystalline silicon layer in close contact with the surface of a refractory metal layer formed on the second semiconductor substrate, applying thermal treatment at 700.degree. C. or below and changing the refractory metal layer to silicide.

Stacked-type semiconductor device

In a semiconductor device with improved lifetime of a capacitor insulating film, a standing wall portion forming a capacitor lower electrode has a substantially round tip end and a side surface, of which roughness is not more than 200 .ANG.. This suppresses concentration of electric field at the tip end of the standing wall portion, and also suppresses irregularity in electric field at its side surface. Thereby, the lifetime of the capacitor insulating film is improved.

Semiconductor memory device having a capacitor

A method of cleaning semiconductor devices which removes or transmutes the contaminants sticking on sidewalls of a pattern or a trench is formed is disclosed. A substrate to be treated on which a pattern or a trench is formed is located in a processing container. A reactive gas which reacts with the contaminants sticking on the sidewall of the pattern or the trench to produce reactive ions which remove or transmute the contaminants is introduced into the processing container. Plasma of the reactive gas is produced by electronic cyclotron resonance in order to produce reactive ions from the reactive gas introduced into the processing container. According to the method, the temperature of the reactive ions in the plasma becomes high, with the result that the motion of the reactive ions in the plasma becomes more active. Accordingly, a velocity vector in a horizontal direction of the reactive ions becomes larger, which enables efficient removal or change in quality of the contaminants sticking on the sidewalls of the pattern or the trench.

Method for cleaning semiconductor devices

A semiconductor device having a substrate, a conductive layer formed on the substrate, an upper insulting film formed on the upper surface of the conductive layer and having a sectional shape with its width reduced upwardly, and a sidewall insulating film formed on the sidewall of the conductive layer and the upper insulating film having a sectional shape with its width reduced upwardly. The shape of the upper insulating film and, particularly, the sidewall insulating film prevent a polycrystalline silicon film formed on the upper insulating film and the sidewall insulating film from having a surface in the vertical direction relative to the substrate. Consequently, the disconnection of an upper layer interconnection can be effectively prevented, and miniaturization of elements can be achieved without forming fence-shaped residue when a conductive layer formed on the sidewall insulating film is anisotropically etched by plasma etching.

Semiconductor device having sidewall insulating film

Disclosed is a method of forming an interconnection pattern which causes no disconnection even when making contact with water in the atmosphere. An interconnection layer is formed on a semiconductor substrate. The interconnection layer is selectively etched by employing a halogen-type gas, to form an interconnection pattern. Ultraviolet rays are directed onto the interconnection pattern in the atmosphere including a hydrogen gas. This method avoids generation of hydrogen halogenide which causes corrosion of metal interconnections even when the metal interconnections make contact with water in the atmosphere, thereby to prevent disconnections of the metal interconnections.

Semiconductor device having an interconnection pattern

An apparatus for cleaning a surface includes first and second reaction containers, a holding apparatus for holding, in the second reaction container, a substance to be processed on the surface of which foreign matter is present, an apparatus for supplying helium gas into the first reaction container, an apparatus for generating helium ions, electrons, and metastable helium by exciting helium gas in the first reaction container, and an apparatus for separating the metastable helium generated in the first reaction container and for introducing the metastable helium into the second reaction container.

Apparatus for cleaning a substrate with metastable helium

A principal feature of the present invention is to clean a surface of a semiconductor substrate without providing a damaged layer to the surface thereof. A native oxide film formed on the surface of a silicon substrate is etched by plasma employing a gas containing fluorine. The surface of the semiconductor substrate is again subjected to plasma etching by employing a gas containing fluorine in order to remove a surface damaged layer and a fluorocarbon layer formed in the above step of plasma etching. The semiconductor substrate surface is irradiated with ultraviolet rays under a low pressure in order to dissociate and remove fluorine atoms chemically adsorbed to the semiconductor substrate surface upon the latter plasma etching.

Method of treating semiconductor substrate surface and method of

A method for anisotropically etching a substrate to be treated using plasma of a reactive gas produced by electron cyclotron resonance is disclosed. A substrate to be treated is located in a processing container, and a chlorine gas and a hydrogen chloride gas are introduced into the processing container. From the mixture of the chlorine and hydrogen chloride gases introduced into the processing container, plasma of the mixed gas is produced by electron cyclotron resonance. According to this method, the energy of the plasma of chlorine is taken by the plasma of H.sup.+, which results in a decrease in kinetic energy of the chlorine. As a result, the plasma of chlorine impinges vertically to the substrate to be treated along the sheath electric field. Consequently, etching with strong anisotropic property is enabled.

Plasma etching method with enhanced anisotropic property and apparatus

Method and apparatus for forming interconnection pattern and

A method of cleaning a surface including generating helium ions, electrons, and metastable helium by exciting helium gas, separating said metastable helium from the helium ions and electrons, and exposing a substance to be processed on the surface of which foreign matter is present to the metastable helium separated from the helium ions and electrons to remove the foreign matter from the substance.

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Hyogo, Japan

Toshiaki Ogawa