Mitsubishi Electric Corporation

Oki Electric Industry Co., Ltd.

Tdk Electronics Company, Limited

Mitsubishi Heavy Industries Limited

Jeol Ltd.

Mitsubishi Heavy Industries, Co., Ltd.

Toshiaki Kato

Katsuhiko Tabuchi

Satoru Tanaka

Hiroyuki Murakami

Daiki Fukui

Daisuke Nakazawa

Yumi Tanaka

Takeo Takakura

Naoyuki Kita

Nobuyuki Kawabata

Junichi Matsumoto

Satoshi Yamasaki

Kenryo Namba

Keiji Eguchi

Akihiro Nakaya

Yasushi Otsuka

Hideki Shiozaki

Shigeru Katakura

Yoshimi Nakamura

Masakatu Saijyo

Masakatsu Shimada

Kotaro Fukuda

Yosinori Okamoto

Takashi Fujiwara

Makoto Shimura

Toshikazu Takase

Masakatsu Saijyo

A break detection device includes a sensor, an abnormal variation detection unit (), a storage unit (), an arithmetic unit (), and a break determination unit (). The arithmetic unit () increases a determination score when the abnormal variation detection unit () detects occurrence of an abnormal variation when a car () passes a position stored in the storage unit (). The arithmetic unit () decreases the determination score when the abnormal variation detection unit () does not detect the occurrence of the abnormal variation when the car () passes the position. The break determination unit () determines whether or not a broken portion is present in a rope on the basis of the determination score.

Break detection device configured to determine whether or not a broken portion is present in a rope

A break detection device includes an extraction unit (), an extraction unit (), a detection unit (), and a determination unit (). The extraction unit () extracts, from an output signal from a sensor, a vibration component in a specific frequency band. The extraction unit () attenuates, from the vibration component extracted by the extraction unit (), a steady vibration component and a progressively increasing vibration component to extract a determination signal. The detection unit () detects, on the basis of the determination signal, occurrence of an abnormal variation in the output signal from the sensor. The determination unit () determines whether or not a rope has a broken portion.

Break detection device

An electric motor control device that can accurately calculate the rotating speed of an electric motor. The electric motor control device includes a speed calculating unit configured to receive, from a position detector that detects a rotational position of an electric motor and outputs a position detection signal including a periodic error determined according to the rotational position, an input of the position detection signal, receive, from a time detector that outputs a position change time signal obtained by detecting a time period in which the position detection signal output from the position detector changes, an input of the position change time signal, and calculate rotating speed of the electric motor based on the position detection signal and the position change time signal. Further, there is a speed correcting unit for correcting a periodic speed error determined according to the rotational position of the electric motor.

Electric motor control device

An elevator control device which can automatically and appropriately set a bus voltage. Therefore, the elevator control device includes a power supply side current controller, a main circuit bus, an inverter, a regenerative resistance, a bus voltage controller, and a control unit which detects a first reference value of a bus voltage of the main circuit bus when the bus voltage of the main circuit bus becomes a receiving voltage from a power supply, detects a second reference value of the bus voltage of the main circuit bus when the regenerative resistance is turned on, and controls the bus voltage controller so that a value of the bus voltage of the main circuit bus becomes a value between the first reference value and the second reference value.

Elevator control device

Providing a half precast slab even in a case where the thickness of the slab in the site condition is too thick to apply conventional precast construction techniques. A half precast slab including a plurality of floor concrete form members and, each floor concrete form member being provided with: a bottom slab of a long length, in response to the floor concrete form member; a pair of side walls installed upright along each longitudinal edge of the bottom slab, in response to the floor concrete form member; thereby, each floor concrete form member is arranged so as to be parallel to each other and be tightly connected to the adjacent floor concrete form member, along the direction perpendicular to the longitudinal direction of each floor concrete form member; the height of the side walls other than the side walls on the most outer edge sides of the whole floor concrete form members is set at a common height that is smaller than the height of the side walls on the most outer edge sides.

Half precast slab and method for structuring half precast slab

An analysis system which permits sample pretreatment which comprises: a sample rack; a sample container supply, a sample dispenser, a solvent-removing evaporator, a solvent dispenser for dispensing a second solvent, a sample-stirring means, a sample aspirating-and-transferring means, a sample recovery means, a sample container recovery means, and a control means for controlling the aforementioned various means.

Analysis system and analysis method

There are provided a method and an apparatus for displaying test results and a recording medium, which allow easy detection of Devices for Testing in which probes are destroyed. The apparatus has two wafer probers, a work station, and a PC. On the basis of a display program and a display mode switching program stored in a ROM of the work station, respective test results of testing semiconductor chips by the two wafer probers are displayed on a CRT of the PC in correspondence to positions of the semiconductor chips on a wafer substrate, and, at the same time, a pass/fail ratio for each of the DFT's is displayed in parallel with the test results of the semiconductor chips.

Method and apparatus for displaying test results and recording medium

A measuring method of the contact resistance of a probe includes bringing a plurality of probes including a first and second probes into contact with a plurality of electrode pads that is disposed on a semiconductor device to be electrically tested and connected each other with a conductive wiring; connecting a power supply to at least one predetermined first probe of the plurality of probes and supplying a current or a voltage from the first probe through the electrode pad and the wiring to the second probe to the semiconductor device; measuring the contact resistance between the electrode pad and the probe based on the current or the voltage supplied to the semiconductor device; judging whether the measured contact resistance is equal to or more than a predetermined value or not; and when the contact resistance is equal to or more than the predetermined value, the probes are cleansed.

Method of measuring contact resistance of probe and method of testing semiconductor device

A substrate for a probe card for use in testing semiconductor IC devices in a lump includes tester power supply terminals which receive a power supply voltage output from a tester. Power supply terminals are connected to a semiconductor IC device to be tested. At least two power supply layers each connect one of the tester power supply terminals to the power supply terminals.

Substrate for a probe card having conductive layers for supplying power to IC devices

There are provided a method and an apparatus for displaying test results and a recording medium, which allow easy detection of Devices for Testing in which probes are destroyed. The apparatus has two wafer probers, a work station, and a PC. On the basis of a display program and a display mode switching program stored in a ROM of the work station, respective test results of testing semiconductor chips by the two wafer probers are displayed on a CRT of the PC in correspondence to positions of the semiconductor chips on a wafer substrate, and, at the same time, a pass/ fail ratio for each of the DFT's is displayed in parallel with the test results of the semiconductor chips.

A silver-silver chloride skin electrode is prepared by coating a composition containing silver grain, silver chloride grain and glass frit on a substrate made of a spinel type crystalline oxide such as ferrite and sintering the coated layer. The electrode is durable to an electroconductive paste.

Silver-silver chloride electrode

In a skin electrode for connecting monitoring equipment to the surface of the skin which is separable into two assemblies: a base assembly adapted to be mounted to the surface of the skin and having a sensing element, and; a terminal assembly adapted to be releasably coupled with the base assembly and having a lead for connection to the monitoring equipment, an improvement wherein the terminal assembly is provided with a magnet while the base assembly is provided with a ferromagnetic element, whereby the releasable coupling and electrical connection of the assemblies may be ensured by the action of the magnet.

Skin electrode

An improved electrode for living body is proposed which is excellent in the stability and reliability in detecting and transmitting the electric signals generated in a living body by the physiological electric phenomena such as electrocardiographic, electromyographic and electroencephalographic signals. The electrode of the invention is characterized by the material which is mainly a titanium hydride or a mixture of a titanium hydride with silver chloride optionally combined with a metal salt with basicity and a carbon powder, e.g. graphite.

Growing community of inventors

Tokyo, Japan

Toshiaki Kato