Kabushiki Kaisha Toshiba

Hitachi Software Engineering Company, Ltd.

Toshiaki Ito

Kenji Yamamoto

Toshifumi Sato

Mikio Izumi

Naotaka Oda

Hisanori Nasu

Junji Yoshii

Toshifumi Hayashi

Toshimasa Watanabe

Hideyuki Kitazono

Shigeru Odanaka

Takuro Tamura

Hirotaka Sakai

Tatsuyuki Maekawa

Hitoshi Fujimiya

Teruji Tarumi

Noriko Yurino

Hiroaki Kenjyo

Atsumi Tsujimoto

It is provided with a reactor water-level measurement system being possible to measure water-level in a reactor core regardless of a state in the reactor core. The reactor water-level measurement system includes a core bottom water-level measuring device that includes a heating element, a heat insulating element installed by surrounding part of the heating element in a height direction of the heating element, and a temperature difference measuring element that measures a temperature difference between an insulated portion of the heating element surrounded by the heat insulating element and a non-insulated portion not surrounded by the heat insulating element, a water-level evaluation device that evaluates a water level of a reactor based on the temperature difference, wherein the core bottom water-level measuring device measures at least a water level from a lower end of a reactor core contained in a reactor pressure vessel to a bottom of the reactor pressure vessel.

Reactor water-level measurement system

A safety protection instrumentation system for a nuclear reactor is constructed by using digital logic. The digital logic includes functional units in which output logic patterns corresponding to all input logic patterns are verified in advance and a functional module formed by combining the functional units.

Safety protection instrumentation system and method of operating the system

An apparatus for verifying a custom IC including a test pattern generating unit for generating a test pattern for verifying a function of the custom IC. The test pattern is output to a master IC and a test IC. The apparatus further includes a comparing unit connected to receive operation signals output from the master IC and the test IC for comparing the operation signals to see if the operation signals are agreed with each other and for generating a comparison signal based on a comparison result, a judging unit connected to receive the comparison signal for judging if there is any abnormality in the test IC and for outputting a judged signal based on a judged result, and a computer connected to receive the judged signal for displaying the judged result of the test IC.

Apparatus and method for verifying custom IC

A verification method is provided for verifying a safety apparatus including a programmable logic device having a plurality of functional elements. The verification method includes the steps of exhaustively verifying the plurality of functional elements on actual hardware, generating a functional element that is the same as one of the functional elements verified on the actual apparatus using a predetermined hardware description language, independently logic-synthesizing each generated functional element into a plurality of first net lists, generating a connection function between the functional elements using the predetermined hardware description language, logic-synthesizing the generated connection function into a second net list corresponding to the connection function, synthesizing the first net lists with the second net list to generate a third net list, writing a logic circuit into the programmable logic device on the basis of the third net list, and verifying the actual programmable logic device.

Method for verifying safety apparatus and safety apparatus verified by the same

Process for producing biochip

The present invention provides a hybridization detection method capable of quantitatively determining the degree of the hybridization between a sample biopolymer and a probe biopolymer. In the method, the amount of a fluorescently labeled probe immobilized on a substrate as a spot is quantitatively determined by determining the fluorescence emitted from a fluorescent material labeling the probe, and the amount of a fluorescently labeled sample hybridized to the probe is quantitatively determined by determining the fluorescence emitted from the fluorescent material labeling the sample. The difference between the amount of the probe and the amount of the sample is normalized with the amount of the probe. Based on the normalized value, the amount of the sample hybridized to the probe can be determined relative to the amount of the probe spotted on the substrate.

Degree of hybridization detection method

An electrophoresis method, comprising simultaneously electrophoresing a test sample containing a plurality of molecules labeled with a plurality of luminescent reagents and a marker sample containing a plurality of molecules with known molecular weights labeled with the same plurality of luminescent reagents.

Electrophoresis method, electrophoresis device, and marker sample used for the same

A scanning apparatus for scanning and reading a luminescent pattern of a sample in a flat-plate shape, having a placing member for placing the sample as an object for reading; a light condensing member for condensing light emitted from the luminescent pattern of the sample; a movement member for moving the light condensing member relative to the placing member; a light receiving member for dividing the light of the luminescent pattern of the sample condensed by the light condensing member into predetermined segments and receiving the light by scanning the light from the segments in a one-dimensional way; a photoelectrical conversion member for converting optical signals of the light received by the light receiving member into electrical signals; a control member for controlling a scan by the light receiving member in accordance with the electrical signals from the photoelectrical conversion member; and a data processing member for converting the electrical signals from the photoelectrical conversion member into digital signals and reconfiguring an image from the optical signals of the light from the segment received selectively in a one-dimensional way. The scanning apparatus can likewise scan and read a non-luminous or less luminous pattern of a sample by allowing light from a plane light source to transmit through the pattern of the sample.

Scanning apparatus

Growing community of inventors

Yokohama, Japan

Toshiaki Ito