Sony Corporation

Advanced Micro Devices Corporation

Toshiaki Iimura

Dale E Gulick

Osamu Ito

Kunio Fukuda

Joe W Peterson

Shin Saito

Masaru Nonogaki

Yasunori Terayama

Yoshimari Yamasaki

Disclosed herein is a demodulating device including, first high-frequency receiving means and second high-frequency receiving means for receiving a high-frequency signal of one of a first frequency and a second frequency, first signal strength detecting means and second signal strength detecting means for detecting strengths of signals received by the first high-frequency receiving means and the second high-frequency receiving means, respectively, and strength determining means for performing control so as to make the second high-frequency receiving means receive a high-frequency signal of the first frequency when the first high-frequency receiving means is made to receive the high-frequency signal of the first frequency and the second high-frequency receiving means is made to receive a high-frequency signal of the second frequency and when the second signal strength detecting means does not detect a predetermined signal strength within a predetermined time after the first signal strength detecting means detects a predetermined signal strength.

Demodulating device

A system for testing an overall system employing an integrated circuit with a modulator thereon is disclosed. The system for testing includes structure for causing the modulator to continually transmit data and structure for causing the continually transmitted data to exhibit extreme frequency deviation. In both instances the structure may be a single register. This register may also include a set of bits that may be set to select a continuous or an alternating pattern or, stated another way, a maximum or a minimum peak frequency deviation.

Self-contained self-testing data modulator

Laser diode driving apparatus

Growing community of inventors

Kanagawa, Japan

Toshiaki Iimura