Lockheed Martin Corporation

Toshi Omori

Lloyd Frederick Linder

Brandon R Davis

Victoria Tabuena Pereira

Douglas A Robl

A latch circuit providing isolated input current paths includes a pair of input transistors that receive a differential input signal. A plurality of steering transistors receive a portion of a differential clock signal. The latch circuit includes a positive output node and a negative output node. A first bypass input current path is associated with the first input transistor and is electrically isolated from the positive output node and the negative output node. A second bypass input current path associated with the second input transistor is also electrically isolated from the positive output node and the negative output node. In a latched state, the clock signal is operative to selectively bias the plurality of steering transistors such that current is steered to one of the first input current path or the second input current path, thereby being isolated from the output nodes.

Latch circuit with isolated input and/or output

A reconfigurable wideband analog-to-digital converter (ADC) system comprising a first converter stage including a first sample and hold circuit for sampling an input signal, a first ADC configured to generate a digital representation of the sampled input signal from the first sample and hold circuit, and a first digital-to-analog converter (DAC) responsive to the output of the first ADC and configured to generate an analog representation of the digital representation of the sampled input signal. A control processor is provided and configured to generate a digital control signal. A current control circuit is responsive to the digital control signal for generating an analog current control signal for selectively altering a characteristic of at least one of the first ADC and the first DAC.

Reconfigurable wideband sub-ranging analog-to-digital converter

A reconfigurable wideband analog-to-digital converter (ADC) system comprising a first converter stage including: a first signal path including a first sample and hold circuit responsive to an input signal for sampling the input signal at a first resolution; a second signal path arranged parallel to the first signal path and including a second sample and hold circuit responsive to the input signal for sampling the input signal at a second resolution; and a control circuit arranged in series with the first and second signal paths and configured to isolate one of the first and second signal paths from an output of the control circuit in response to a control signal.

Front end sample and hold circuit for a reconfigurable analog-to-digital converter

A flash analog to digital converter (ADC) provides a temperature compensated trim current by applying a first temperature compensated reference current across a replica resistor ladder. The reference current is mirrored to a trim digital to analog converter, which outputs a fractional portion of the temperature compensated reference current. The proportional trim current is then fed back to the reference current to provide a trimmed temperature compensated reference current. The trimmed reference current is mirrored across the output resistor ladder providing a trimmed current in which the trim varies along with temperature changes due to the trim current being a proportion of the temperature compensated reference current. A proportional trim current which varies with temperature changes is applied to the gain current trim and mismatch current trim in a DAC of a quantizing stage of a sub-ranging ADC.

Apparatus and method for temperature compensated gain and mismatch trim in subranging quantizers and analog to digital converters

A reconfigurable wideband analog-to-digital converter (ADC) system comprising a first converter stage having a first signal path including a first sample and hold circuit for sampling an input signal at a first resolution, and a second signal path responsive to the input signal and arranged in parallel with the first signal path. The second signal path includes a second sample and hold circuit for sampling the input signal at a second resolution. A first ADC is also included for generating a digital representation of the input signal sampled by the first converter stage. A control processor is arranged between outputs of the first and second sample and hold circuits and the input of the ADC for selectively providing the signal sampled by one of the first or second sample and hold circuit to the input of the ADC.

A clocking scheme for a reconfigurable wideband analog-to-digital converter (ADC) including a plurality of Delay Locked Loops (DLLs) arranged in parallel. Each DLL is responsive to an input clock signal and configured to selectively generate a plurality of output clock signals for controlling the operation of the ADC.

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Manlius, NY, United States of America

Toshi Omori