Average Co-Inventor Count = 2.06
ph-index = 1
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Horiba Stec, Co., Ltd. (12 from 202 patents)
2. Canon Kabushiki Kaisha (1 from 90,631 patents)
3. Tokyo Electron Limited (1 from 10,307 patents)
13 patents:
1. 12332175 - Optical measurement cell, optical analyzer, window forming member, and method of manufacturing optical measurement cell
2. 11892395 - Optical measurement cell and optical analysis device
3. 11796460 - Absorbance analysis apparatus for DCR gas, absorbance analysis method for DCR gas, and absorbance analysis program recording medium on which program for DCR gas is recorded
4. 11698649 - Vaporization system and concentration control module used in the same
5. 11631596 - Concentration control apparatus, source consumption quantity estimation method, and program recording medium on which a program for a concentration control apparatus is recorded
6. 11519070 - Vaporization device, film formation device, program for a concentration control mechanism, and concentration control method
7. 11493443 - Light absorbance analysis apparatus and program record medium for recording programs of light absorbance analysis apparatus
8. 11365480 - Concentration control apparatus, zero point adjustment method, and program recording medium recorded with concentration control apparatus program
9. 11226235 - Absorption spectroscopic system, program recording medium for an absorption spectroscopic system and absorbance measurement method
10. 11225719 - Concentration controller, gas control system, deposition apparatus, concentration control method, and program recording medium for concentration controller
11. 10718050 - Concentration control apparatus and material gas supply system
12. 10655220 - Gas control system, deposition apparatus including gas control system, and program and gas control method used for gas control system
13. 9297646 - Measurement method and measurement apparatus