Carl Zeiss Microscopy Gmbh

Carl Zeiss Ag

Torsten Sievers

Christian Thomas

Alexander Thesen

Christian Wojek

Michael Kieweg

Vladan Blahnik

Michael Wick

A method for creating a second series of individual images with a first series of individual images, the individual images of the first or the second series of individual images having been captured with an objective, includes determining the entrance pupil and the field of vision of the objective for the individual images of the first series and creating or adapting the individual images of the second series in accordance with the entrance pupil and the field of vision of the objective of the individual image in question of the first series.

Method and data processing system for creating or adapting individual images based on properties of a light ray within a lens

A slide system for optical microscopy using immersion fluid including a cover glass having a first refractive index and a transparent film having a second refractive index. The second refractive index of the transparent film is matched to the first refractive index of the cover glass. The transparent film protects the cover glass from immersion fluid used for optical microscopy and the transparent film is configured such that the immersion fluid used can be removed by lifting off the transparent film.

Microscopic examination of an object using a sequence of optical microscopy and particle beam microscopy

For the microscopy of an object using a combination of optical microscopy and particle beam microscopy, a microscope slide system comprises an electrically conductive holder, wherein at least one window is configured in the holder, and wherein the holder has the dimensions of a standard glass microscope slide for the optical microscopy; a microscope slide element, which is designed to carry the object for the microscopy and which is designed such that the element can be placed over the window; and a fastening device, which is designed to fix the microscope slide element over the window. By means of said microscope slide system, the object can be analyzed using separate microscopes, without having to relocate the object.

A method for the microscopy of samples using optical microscopy and particle beam microscopy provides that the samples are divided into a partial quantity and a residual quantity and the samples of the partial quantity are prepared to contain registration marks. The samples of the partial quantity are imaged using optical microscopy and particle beam microscopy, with the result that a pair of optical microscopy images and particle beam microscopy images is obtained for each sample of the partial quantity. The pairs are position-registered relative to each other using the registration marks. The images of the position-registered pairs are modified by removing the registration marks. A registration algorithm is trained which evaluates the image contents and issues a quality measure for a position registration of each pair. The objects of the residual quantity are imaged. These pairs are position-registered by the trained registration algorithm to maximize the quality measure.

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Heidenheim an der Brenz, Germany

Torsten Sievers