Carl Zeiss Jena Gmbh

Carl Zeiss Ag

Cad Zeiss Jena Gmbh

Torsten Antrack

Ralph Lange

Martin Voelcker

Mario Sondermann

Karlheinz Bartzke

Gunther Lorenz

Winfried Wiegraebe

Eberhard Seydel

An optical arrangement includes a stack structure comprising at least three prisms. The optical arrangement includes a main optical path and for each of the prisms, a secondary optical path. The optical arrangement also includes at least one interface. Each of the at least one interface is arranged between a corresponding first stack section of the stack structure and a corresponding second stack section of the stack structure. Each of the at least one interface is configured to enable relative movement of the corresponding first stack section and of the corresponding second stack section with respect to one another.

Multi-way prism

Near-field optical microscope with a probe tip which is arranged on one side of a light-transmitting specimen and moved in a scanning manner. The probe tip serves as a point light source. Optics for collecting light transmitted through the specimen and transmitting it to a detection unit or for collecting illumination light are provided on the other side of the specimen. The movement of the probe tip is adapted to on the detection side, or the probe serves to detect specimen light. A detection unit is arranged following the probe in the direction of illumination, and a scanning illumination adapted to the probe movement is carried out on the other side of the specimen.

Optical near-field microscope

An illumination device for a light microscope comprises a scanning microscope probe which is integrated in the center thereof. A scanning probe microscope comprising such illumination device is also disclosed.

Scanning probe microscope with probe integrated in an optical system

Probe element for coordinate measurement systems

Growing community of inventors

Jena, Germany

Torsten Antrack